Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

SPIE

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About the journal

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE is a journal published by SPIE. It is listed in PUBMED according to the sources read. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.

Basic facts

Publisher
SPIE
ISSN
1996-756X · 0277-786X
Access
Not open access / not declared

Index listings

  • PUBMED · 1984-06-15
Indexing
PUBMED
APC
—
Declared review time (DOAJ)
—
Activity (OpenAlex)
Active — latest works 2026
PublishLens list status
Shown after sign-in
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Methodology signals (dated facts from their sources)

Details of the evaluation under the published methodology are shown to signed-in users (free).

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Journal profile

Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.

Works in OpenAlex

436477

Last recorded publication year

2022

Reported by OpenAlex in 1 of 3 sources (CC0 flags, not verified indexing)DOAJSciELOOpenAlex Core

h-index

235

i10-index

45217

From OpenAlex open data (CC0).

Editorial & policy2
Observed digital preservation (Keepers registry)— snapshot 2026-10-05
Portico
Norwegian register (HK-dir)— 2026
Level 1 — approved scholarly channel
Identity & continuity3
Alternate titles
SPIE proceedings seriesProceedings of SPIEProceedings of Society of Photo-optical Instrumentation EngineersProceedings of The International Society for Optical Engineering
Source type
journal
NLM unique ID (PubMed)
101524122
Classification(no data)

No data available to the platform for this group

No platform data for: Classification — absence is not a judgment about the journal.

Subject areas

  • Photonic and Optical Devices
  • Photonic and Optical Devices
  • Semiconductor Lasers and Optical Devices
  • Semiconductor Lasers and Optical Devices
  • Advanced Fiber Optic Sensors
  • Advanced Fiber Optic Sensors
  • Adaptive optics and wavefront sensing
  • Adaptive optics and wavefront sensing
Show all subjects (50)
  • Advancements in Photolithography Techniques
  • Advancements in Photolithography Techniques
  • Infrared Target Detection Methodologies
  • Infrared Target Detection Methodologies
  • Laser Design and Applications
  • Laser Design and Applications
  • Optical measurement and interference techniques
  • Optical measurement and interference techniques
  • Optical Coatings and Gratings
  • Optical Coatings and Gratings
  • Advanced Measurement and Metrology Techniques
  • Advanced Measurement and Metrology Techniques
  • Optical Systems and Laser Technology
  • Optical Systems and Laser Technology
  • Advanced Fiber Laser Technologies
  • Advanced Fiber Laser Technologies
  • Calibration and Measurement Techniques
  • Calibration and Measurement Techniques
  • Optical Network Technologies
  • Optical Network Technologies
  • Laser Material Processing Techniques
  • Laser Material Processing Techniques
  • Advanced optical system design
  • Advanced optical system design
  • Surface Roughness and Optical Measurements
  • Surface Roughness and Optical Measurements
  • Solid State Laser Technologies
  • Solid State Laser Technologies
  • Spectroscopy and Laser Applications
  • Spectroscopy and Laser Applications
  • Photoacoustic and Ultrasonic Imaging
  • Photoacoustic and Ultrasonic Imaging
  • Advanced Optical Sensing Technologies
  • Advanced Optical Sensing Technologies
  • Photorefractive and Nonlinear Optics
  • Photorefractive and Nonlinear Optics
  • Semiconductor Quantum Structures and Devices
  • Semiconductor Quantum Structures and Devices
  • Advanced Surface Polishing Techniques
  • Advanced Surface Polishing Techniques
  • Advanced Optical Imaging Technologies
  • Advanced Optical Imaging Technologies

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The journal's record in other sources:Web of Science MJLDOAJ

Everything shown here is produced automatically from named sources (DOAJ, OpenAlex, Crossref, PubMed, the Norwegian register) as of its capture date, with no human editing. Facts appear as recorded at the source; derived scores (PCI, PTD, PublishLens score) follow a published methodology. Not a judgement on the journal, not an official accreditation, not advice.

Wrong items are corrected automatically by re-reading the source (24 h for daily sources, 7 days for weekly ones) with a dated change log, and each item links to its source record. PublishLens-derived assessments are contested through the appeals mechanism (15 working days). Appeals · Indicator guide

Norwegian register data: Kanalregisteret (HK-dir, Norway) — CC BY 4.0 / NLOD — adapted: level extracted per year · OASPA member list — CC BY

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