ACS Applied Electronic Materials

American Chemical Society

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About the journal

ACS Applied Electronic Materials is a journal published by American Chemical Society in United States. It is listed in PUBMED according to the sources read. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.

Basic facts

Publisher
American Chemical Society
ISSN
2637-6113
Country
United States
Access
Not open access / not declared

Index listings

  • PUBMED · 2019-01-22
Indexing
PUBMED
APC
—
Declared review time (DOAJ)
—
Activity (OpenAlex)
Active — latest works 2026
PublishLens list status
Shown after sign-in
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Methodology signals (dated facts from their sources)

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Journal profile

Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.

Works in OpenAlex

5459

Last recorded publication year

2026

Reported by OpenAlex in 1 of 3 sources (CC0 flags, not verified indexing)DOAJSciELOOpenAlex Core

h-index

82

i10-index

2152

From OpenAlex open data (CC0).

Editorial & policy5
Observed digital preservation (Keepers registry)— snapshot 2026-10-05
Portico
Norwegian register (HK-dir)— 2026
Level 1 — approved scholarly channel
Open references deposited at Crossref
96%
ORCID iDs in current deposits
96%
Enrolled in Crossref Similarity Check
✓
Deposits licence metadata at Crossref
✓
Identity & continuity3
Alternate titles
Applied electronic materialsAmerican Chemical Society applied electronic materials
Source type
journal
NLM unique ID (PubMed)
101734996
Classification(no data)

No data available to the platform for this group

No platform data for: Classification — absence is not a judgment about the journal.

Subject areas

  • Advanced Sensor and Energy Harvesting Materials
  • Advanced Sensor and Energy Harvesting Materials
  • Conducting polymers and applications
  • Conducting polymers and applications
  • Advanced Memory and Neural Computing
  • Advanced Memory and Neural Computing
  • 2D Materials and Applications
  • 2D Materials and Applications
Show all subjects (50)
  • Perovskite Materials and Applications
  • Perovskite Materials and Applications
  • ZnO doping and properties
  • ZnO doping and properties
  • Semiconductor materials and devices
  • Semiconductor materials and devices
  • Gas Sensing Nanomaterials and Sensors
  • Gas Sensing Nanomaterials and Sensors
  • Ferroelectric and Negative Capacitance Devices
  • Ferroelectric and Negative Capacitance Devices
  • Graphene research and applications
  • MXene and MAX Phase Materials
  • Graphene research and applications
  • MXene and MAX Phase Materials
  • Organic Electronics and Photovoltaics
  • Transition Metal Oxide Nanomaterials
  • Organic Electronics and Photovoltaics
  • Transition Metal Oxide Nanomaterials
  • Thin-Film Transistor Technologies
  • Ga2O3 and related materials
  • Ga2O3 and related materials
  • Thin-Film Transistor Technologies
  • Ferroelectric and Piezoelectric Materials
  • Ferroelectric and Piezoelectric Materials
  • Quantum Dots Synthesis And Properties
  • Electronic and Structural Properties of Oxides
  • Quantum Dots Synthesis And Properties
  • Nanowire Synthesis and Applications
  • Nanowire Synthesis and Applications
  • Electronic and Structural Properties of Oxides
  • Supercapacitor Materials and Fabrication
  • Supercapacitor Materials and Fabrication
  • Dielectric materials and actuators
  • Nanomaterials and Printing Technologies
  • Nanomaterials and Printing Technologies
  • Chalcogenide Semiconductor Thin Films
  • Chalcogenide Semiconductor Thin Films
  • Dielectric materials and actuators
  • Analytical Chemistry and Sensors
  • Analytical Chemistry and Sensors
  • Organic Light-Emitting Diodes Research
  • Organic Light-Emitting Diodes Research

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The journal's record in other sources:Web of Science MJLDOAJ

Everything shown here is produced automatically from named sources (DOAJ, OpenAlex, Crossref, PubMed, the Norwegian register) as of its capture date, with no human editing. Facts appear as recorded at the source; derived scores (PCI, PTD, PublishLens score) follow a published methodology. Not a judgement on the journal, not an official accreditation, not advice.

Wrong items are corrected automatically by re-reading the source (24 h for daily sources, 7 days for weekly ones) with a dated change log, and each item links to its source record. PublishLens-derived assessments are contested through the appeals mechanism (15 working days). Appeals · Indicator guide

Norwegian register data: Kanalregisteret (HK-dir, Norway) — CC BY 4.0 / NLOD — adapted: level extracted per year · OASPA member list — CC BY

Last automated source read: