Journal of Lightwave Technology

Institute of Electrical and Electronics Engineers

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About the journal

Journal of Lightwave Technology is a journal published by Institute of Electrical and Electronics Engineers in United States. It is listed in PUBMED according to the sources read. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.

Basic facts

Publisher
Institute of Electrical and Electronics Engineers
ISSN
0733-8724 · 1558-2213
Country
United States
Access
Not open access / not declared

Index listings

  • PUBMED · 2015-05-01
Indexing
PUBMED
APC
—
Declared review time (DOAJ)
—
Activity (OpenAlex)
Active — latest works 2026
PublishLens list status
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Methodology signals (dated facts from their sources)

Details of the evaluation under the published methodology are shown to signed-in users (free).

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Journal profile

Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.

Works in OpenAlex

24995

Last recorded publication year

2026

Reported by OpenAlex in 1 of 3 sources (CC0 flags, not verified indexing)DOAJSciELOOpenAlex Core

h-index

262

i10-index

13486

From OpenAlex open data (CC0).

Editorial & policy5
Observed digital preservation (Keepers registry)— snapshot 2026-10-05
Portico
Norwegian register (HK-dir)— 2026
Level 1 — approved scholarly channel
Open references deposited at Crossref
86%
ORCID iDs in current deposits
88%
Enrolled in Crossref Similarity Check
✓
Deposits licence metadata at Crossref
✓
Identity & continuity1
Source type
journal
Classification(no data)

No data available to the platform for this group

No platform data for: Classification — absence is not a judgment about the journal.

Subject areas

  • Optical Network Technologies
  • Optical Network Technologies
  • Photonic and Optical Devices
  • Photonic and Optical Devices
  • Advanced Photonic Communication Systems
  • Advanced Photonic Communication Systems
  • Semiconductor Lasers and Optical Devices
  • Semiconductor Lasers and Optical Devices
Show all subjects (50)
  • Advanced Fiber Optic Sensors
  • Advanced Fiber Optic Sensors
  • Advanced Fiber Laser Technologies
  • Advanced Fiber Laser Technologies
  • Advanced Optical Network Technologies
  • Advanced Optical Network Technologies
  • Photonic Crystal and Fiber Optics
  • Photonic Crystal and Fiber Optics
  • Optical Wireless Communication Technologies
  • Optical Wireless Communication Technologies
  • Photonic Crystals and Applications
  • Photonic Crystals and Applications
  • Optical Coatings and Gratings
  • Optical Coatings and Gratings
  • Ferroelectric and Negative Capacitance Devices
  • Ferroelectric and Negative Capacitance Devices
  • Semiconductor Quantum Structures and Devices
  • Semiconductor Quantum Structures and Devices
  • Diverse Scientific and Economic Studies
  • Diverse Scientific and Economic Studies
  • Neural Networks and Reservoir Computing
  • Neural Networks and Reservoir Computing
  • Photorefractive and Nonlinear Optics
  • Photorefractive and Nonlinear Optics
  • Plasmonic and Surface Plasmon Research
  • Plasmonic and Surface Plasmon Research
  • Mechanical and Optical Resonators
  • Mechanical and Optical Resonators
  • Magneto-Optical Properties and Applications
  • Magneto-Optical Properties and Applications
  • Advanced Optical Sensing Technologies
  • Advanced Optical Sensing Technologies
  • graph theory and CDMA systems
  • graph theory and CDMA systems
  • Big Data and Digital Economy
  • Big Data and Digital Economy
  • Solid State Laser Technologies
  • Optical Coherence Tomography Applications
  • PAPR reduction in OFDM
  • PAPR reduction in OFDM
  • Solid State Laser Technologies
  • Optical Coherence Tomography Applications

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The journal's record in other sources:Web of Science MJLDOAJ

Everything shown here is produced automatically from named sources (DOAJ, OpenAlex, Crossref, PubMed, the Norwegian register) as of its capture date, with no human editing. Facts appear as recorded at the source; derived scores (PCI, PTD, PublishLens score) follow a published methodology. Not a judgement on the journal, not an official accreditation, not advice.

Wrong items are corrected automatically by re-reading the source (24 h for daily sources, 7 days for weekly ones) with a dated change log, and each item links to its source record. PublishLens-derived assessments are contested through the appeals mechanism (15 working days). Appeals · Indicator guide

Norwegian register data: Kanalregisteret (HK-dir, Norway) — CC BY 4.0 / NLOD — adapted: level extracted per year · OASPA member list — CC BY

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