Applied Physics Letters

American Institute of Physics

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About the journal

Applied Physics Letters is a journal published by American Institute of Physics in United States. It is listed in PUBMED according to the sources read. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.

Basic facts

Publisher
American Institute of Physics
ISSN
0003-6951 · 1077-3118
Country
United States
Access
Not open access / not declared
Official website
http://apl.aip.org/

Index listings

  • PUBMED · 2003-12-01
Indexing
PUBMED
APC
—
Declared review time (DOAJ)
—
Activity (OpenAlex)
Active — latest works 2026
PublishLens list status
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Methodology signals (dated facts from their sources)

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Journal profile

Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.

Works in OpenAlex

141444

Last recorded publication year

2026

Reported by OpenAlex in 1 of 3 sources (CC0 flags, not verified indexing)DOAJSciELOOpenAlex Core

h-index

559

i10-index

103744

From OpenAlex open data (CC0).

Editorial & policy5
Observed digital preservation (Keepers registry)— snapshot 2026-10-05
CLOCKSSPortico
Norwegian register (HK-dir)— 2027
Level 2 — top tier (~20% of the field's channels)
Open references deposited at Crossref
100%
ORCID iDs in current deposits
100%
Enrolled in Crossref Similarity Check
✓
Deposits licence metadata at Crossref
✓
Identity & continuity3
Alternate titles
Applied physics letters on CD-ROMAPL on CD-ROM
Source type
journal
NLM unique ID (PubMed)
9881183
Classification(no data)

No data available to the platform for this group

No platform data for: Classification — absence is not a judgment about the journal.

Subject areas

  • Semiconductor Quantum Structures and Devices
  • Semiconductor Quantum Structures and Devices
  • Semiconductor materials and devices
  • Semiconductor materials and devices
  • Photonic and Optical Devices
  • Photonic and Optical Devices
  • GaN-based semiconductor devices and materials
  • GaN-based semiconductor devices and materials
Show all subjects (50)
  • ZnO doping and properties
  • ZnO doping and properties
  • Magnetic properties of thin films
  • Magnetic properties of thin films
  • Quantum and electron transport phenomena
  • Quantum and electron transport phenomena
  • Semiconductor materials and interfaces
  • Semiconductor materials and interfaces
  • Semiconductor Lasers and Optical Devices
  • Semiconductor Lasers and Optical Devices
  • Ferroelectric and Piezoelectric Materials
  • Ferroelectric and Piezoelectric Materials
  • Thin-Film Transistor Technologies
  • Thin-Film Transistor Technologies
  • Electronic and Structural Properties of Oxides
  • Electronic and Structural Properties of Oxides
  • Silicon Nanostructures and Photoluminescence
  • Silicon Nanostructures and Photoluminescence
  • Physics of Superconductivity and Magnetism
  • Physics of Superconductivity and Magnetism
  • Ga2O3 and related materials
  • Ga2O3 and related materials
  • Nanowire Synthesis and Applications
  • Nanowire Synthesis and Applications
  • Advancements in Semiconductor Devices and Circuit Design
  • Advancements in Semiconductor Devices and Circuit Design
  • Graphene research and applications
  • Graphene research and applications
  • Acoustic Wave Resonator Technologies
  • Acoustic Wave Resonator Technologies
  • Silicon and Solar Cell Technologies
  • Silicon and Solar Cell Technologies
  • Magnetic and transport properties of perovskites and related materials
  • Magnetic and transport properties of perovskites and related materials
  • Quantum Dots Synthesis And Properties
  • Quantum Dots Synthesis And Properties
  • Photonic Crystals and Applications
  • Photonic Crystals and Applications
  • Advanced Semiconductor Detectors and Materials
  • Advanced Semiconductor Detectors and Materials
  • Advanced Fiber Laser Technologies
  • Advanced Fiber Laser Technologies

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The journal's record in other sources:Web of Science MJLDOAJ

Everything shown here is produced automatically from named sources (DOAJ, OpenAlex, Crossref, PubMed, the Norwegian register) as of its capture date, with no human editing. Facts appear as recorded at the source; derived scores (PCI, PTD, PublishLens score) follow a published methodology. Not a judgement on the journal, not an official accreditation, not advice.

Wrong items are corrected automatically by re-reading the source (24 h for daily sources, 7 days for weekly ones) with a dated change log, and each item links to its source record. PublishLens-derived assessments are contested through the appeals mechanism (15 working days). Appeals · Indicator guide

Norwegian register data: Kanalregisteret (HK-dir, Norway) — CC BY 4.0 / NLOD — adapted: level extracted per year · OASPA member list — CC BY

Last automated source read: