About the journal
Sensors and Materials is an open-access journal published by MYU in Japan, publishing in english. It is listed in DOAJ according to the sources read. Declared publication charge: 99,360 JPY. Declared review time at DOAJ: 9 weeks. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.
Basic facts
- Publisher
- MYU
- ISSN
- 0914-4935 · 2435-0869
- Country
- Japan
- Languages
- english
- Access
- Open access
- Declared publication charge
- 99,360 JPY
- Articles in DOAJ
- 0
- Declared review time
- 9 weeks
- Declared peer-review model
- peer_review
- Official website
- https://myukk.org/
Index listings
- DOAJ · 2019-09-02
- Indexing
- DOAJ
- APC
- 99,360 JPY
- Declared review time (DOAJ)
- 9 weeks — journal-declared only (not measured)
- Activity (OpenAlex)
- Active — latest works 2026
- PublishLens list status
- Shown after sign-in
- Counts for promotion at your university?
- Choose your university and rank below ↓
Methodology signals (dated facts from their sources)
Details of the evaluation under the published methodology are shown to signed-in users (free).
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Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.
Articles in DOAJ
0
Average review time (journal-declared via DOAJ)
9weeks
Works in OpenAlex
4130
Last recorded publication year
2026
h-index
32
i10-index
318
From OpenAlex open data (CC0).
Editorial & policy9
- Last DOAJ review date
- 2022-09-16
- Added to DOAJ
- 2019-09-02
- Declared plagiarism screening
- Not declared
- Other fees beyond APC
- No
- Editorial board
- Official page ↗
- Norwegian register (HK-dir)— 2026
- Level 1 — approved scholarly channel
- Open references deposited at Crossref
- 0%
- ORCID iDs in current deposits
- 0%
- Peer-review policy
- View policy
Identity & continuity1
- Source type
- journal
Classification2
Subjects (DOAJ)
LCC codes
Subject areas
- Gas Sensing Nanomaterials and Sensors
- Gas Sensing Nanomaterials and Sensors
- Analytical Chemistry and Sensors
- Analytical Chemistry and Sensors
- Advanced Chemical Sensor Technologies
- Advanced Chemical Sensor Technologies
- Radiation Detection and Scintillator Technologies
- Radiation Detection and Scintillator Technologies
Show all subjects (50)
- Luminescence Properties of Advanced Materials
- Luminescence Properties of Advanced Materials
- Advanced MEMS and NEMS Technologies
- Advanced MEMS and NEMS Technologies
- Industrial Vision Systems and Defect Detection
- Industrial Vision Systems and Defect Detection
- Electrochemical sensors and biosensors
- Electrochemical sensors and biosensors
- Sensor Technology and Measurement Systems
- Sensor Technology and Measurement Systems
- Advanced Fiber Optic Sensors
- Advanced Fiber Optic Sensors
- Advanced Sensor and Energy Harvesting Materials
- Advanced Sensor and Energy Harvesting Materials
- Remote Sensing and Land Use
- Remote Sensing and Land Use
- Advanced Sensor and Control Systems
- Advanced Sensor and Control Systems
- Advanced biosensing and bioanalysis techniques
- Photonic and Optical Devices
- Acoustic Wave Resonator Technologies
- Advanced biosensing and bioanalysis techniques
- Acoustic Wave Resonator Technologies
- Photonic and Optical Devices
- Advanced Algorithms and Applications
- Advanced Algorithms and Applications
- Advanced Surface Polishing Techniques
- Advanced Surface Polishing Techniques
- Conducting polymers and applications
- Conducting polymers and applications
- IoT-based Smart Home Systems
- IoT-based Smart Home Systems
- Engineering Applied Research
- Engineering Applied Research
- Advanced machining processes and optimization
- Advanced machining processes and optimization
- Remote Sensing and LiDAR Applications
- Remote Sensing and LiDAR Applications
- Water Quality Monitoring Technologies
- Water Quality Monitoring Technologies
- Wireless Sensor Networks and IoT
- Wireless Sensor Networks and IoT
Keywords (DOAJ)
- sensor
- material
- sensor application
- sensor technology
Community confirmations — what users saw in MJL or Scopus Sources; not platform verification and never part of any score.
The journal's record in other sources:Web of Science MJLDOAJ