He jishu

Science Press

Journal websitePeer review: Peer review
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About the journal

He jishu is an open-access journal published by Science Press in China, publishing in chinese. It is listed in DOAJ according to the sources read. Declared review time at DOAJ: 16 weeks. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.

Basic facts

Publisher
Science Press
ISSN
0253-3219
Country
China
Languages
chinese
Access
Open access
Articles in DOAJ
899
Declared review time
16 weeks
Declared peer-review model
peer_review

Index listings

  • DOAJ · 2022-10-10
Indexing
DOAJ
APC
—
Declared review time (DOAJ)
16 weeks — journal-declared only (not measured)
Activity (OpenAlex)
Active — latest works 2026
PublishLens list status
Shown after sign-in
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Methodology signals (dated facts from their sources)

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Journal profile

Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.

Articles in DOAJ

899

Most recent article

3 months ago

Average review time (journal-declared via DOAJ)

16weeks

Works in OpenAlex

3348

Last recorded publication year

2026

Reported by OpenAlex in 1 of 3 sources (CC0 flags, not verified indexing)DOAJSciELOOpenAlex Core

h-index

7

i10-index

4

From OpenAlex open data (CC0).

Editorial & policy9
Last DOAJ review date
2022-10-10
Added to DOAJ
2022-10-10
Declared plagiarism screening
Declared
Other fees beyond APC
Yes
Editorial board
Official page ↗
Open references deposited at Crossref
100%
ORCID iDs in current deposits
0%
Enrolled in Crossref Similarity Check
✓
Peer-review policy
View policy
Identity & continuity2
Alternate titles
Nuclear techniques
Source type
journal
Classification2

Subjects (DOAJ)

Technology: Electrical engineering. Electronics. Nuclear engineering: Nuclear engineering. Atomic power

LCC codes

TK9001-9401

Subject areas

  • Nuclear Physics and Applications
  • Nuclear Physics and Applications
  • Radiation Detection and Scintillator Technologies
  • Radiation Detection and Scintillator Technologies
  • Nuclear reactor physics and engineering
  • Nuclear reactor physics and engineering
  • Medical Imaging Techniques and Applications
  • Medical Imaging Techniques and Applications
Show all subjects (50)
  • Particle accelerators and beam dynamics
  • Particle accelerators and beam dynamics
  • Particle Accelerators and Free-Electron Lasers
  • Particle Accelerators and Free-Electron Lasers
  • Radiopharmaceutical Chemistry and Applications
  • Radiopharmaceutical Chemistry and Applications
  • Ion-surface interactions and analysis
  • Ion-surface interactions and analysis
  • X-ray Spectroscopy and Fluorescence Analysis
  • X-ray Spectroscopy and Fluorescence Analysis
  • Metal and Thin Film Mechanics
  • Metal and Thin Film Mechanics
  • Advanced X-ray Imaging Techniques
  • Advanced X-ray Imaging Techniques
  • Radioactivity and Radon Measurements
  • Radioactivity and Radon Measurements
  • Particle Detector Development and Performance
  • Particle Detector Development and Performance
  • Radiation Therapy and Dosimetry
  • Radiation Therapy and Dosimetry
  • Superconducting Materials and Applications
  • Superconducting Materials and Applications
  • Nuclear Materials and Properties
  • Graphite, nuclear technology, radiation studies
  • Nuclear Materials and Properties
  • Graphite, nuclear technology, radiation studies
  • Radiation Effects in Electronics
  • Radiation Effects in Electronics
  • Nuclear Engineering Thermal-Hydraulics
  • Muon and positron interactions and applications
  • Muon and positron interactions and applications
  • Radioactive element chemistry and processing
  • Nuclear Engineering Thermal-Hydraulics
  • Radioactive element chemistry and processing
  • Radioactive contamination and transfer
  • Advanced X-ray and CT Imaging
  • Advanced X-ray and CT Imaging
  • Electron and X-Ray Spectroscopy Techniques
  • Electron and X-Ray Spectroscopy Techniques
  • Radioactive contamination and transfer
  • Integrated Circuits and Semiconductor Failure Analysis
  • Integrated Circuits and Semiconductor Failure Analysis

Keywords (DOAJ)

  • synchrotron radiation
  • nuclear physics
  • nuclear energy
  • nuclear analysis
  • radiopharmaceuticals
  • accelerator and ray technology

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The journal's record in other sources:Web of Science MJLDOAJ

Everything shown here is produced automatically from named sources (DOAJ, OpenAlex, Crossref, PubMed, the Norwegian register) as of its capture date, with no human editing. Facts appear as recorded at the source; derived scores (PCI, PTD, PublishLens score) follow a published methodology. Not a judgement on the journal, not an official accreditation, not advice.

Wrong items are corrected automatically by re-reading the source (24 h for daily sources, 7 days for weekly ones) with a dated change log, and each item links to its source record. PublishLens-derived assessments are contested through the appeals mechanism (15 working days). Appeals · Indicator guide

Norwegian register data: Kanalregisteret (HK-dir, Norway) — CC BY 4.0 / NLOD — adapted: level extracted per year · OASPA member list — CC BY

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