About the journal
APL Electronic Devices is an open-access journal published by AIP Publishing LLC in United States, publishing in english. It is listed in DOAJ according to the sources read. Declared publication charge: 2,750 USD. Declared review time at DOAJ: 14 weeks. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.
Basic facts
- Publisher
- AIP Publishing LLC
- ISSN
- 2995-8423
- Country
- United States
- Languages
- english
- Access
- Open access
- Declared publication charge
- 2,750 USD
- Articles in DOAJ
- 193
- Declared review time
- 14 weeks
- Declared peer-review model
- peer_review
- Official website
- https://pubs.aip.org/aip/aed
Index listings
- DOAJ · 2025-09-29
- Indexing
- DOAJ
- APC
- 2,750 USD
- Declared review time (DOAJ)
- 14 weeks — journal-declared only (not measured)
- Activity (OpenAlex)
- Active — latest works 2026
- PublishLens list status
- Shown after sign-in
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- Choose your university and rank below ↓
Methodology signals (dated facts from their sources)
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Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.
Articles in DOAJ
193
Most recent article
last month
Average review time (journal-declared via DOAJ)
14weeks
Works in OpenAlex
188
Last recorded publication year
2026
h-index
8
i10-index
6
From OpenAlex open data (CC0).
Editorial & policy13
- Last DOAJ review date
- 2025-10-21
- Added to DOAJ
- 2025-09-29
- Declared plagiarism screening
- Declared
- Other fees beyond APC
- No
- Declared digital preservation
- CLOCKSSPortico
- Observed digital preservation (Keepers registry)— snapshot 2026-10-05
- CLOCKSSPortico
- Editorial board
- Official page ↗
- Norwegian register (HK-dir)— 2026
- Level 1 — approved scholarly channel
- Open references deposited at Crossref
- 99%
- ORCID iDs in current deposits
- 100%
- Enrolled in Crossref Similarity Check
- ✓
- Deposits licence metadata at Crossref
- ✓
- APC waiver policy
- View policy
- Peer-review policy
- View policy
Identity & continuity1
- Source type
- journal
Classification2
Subjects (DOAJ)
LCC codes
Subject areas
- GaN-based semiconductor devices and materials
- GaN-based semiconductor devices and materials
- Semiconductor materials and devices
- Semiconductor materials and devices
- Silicon Carbide Semiconductor Technologies
- Silicon Carbide Semiconductor Technologies
- Ga2O3 and related materials
- Ga2O3 and related materials
Show all subjects (50)
- Advanced Sensor and Energy Harvesting Materials
- Advanced Sensor and Energy Harvesting Materials
- Advancements in Semiconductor Devices and Circuit Design
- Advancements in Semiconductor Devices and Circuit Design
- ZnO doping and properties
- ZnO doping and properties
- Advanced Memory and Neural Computing
- Advanced Memory and Neural Computing
- Semiconductor Quantum Structures and Devices
- Thin-Film Transistor Technologies
- 2D Materials and Applications
- Semiconductor Quantum Structures and Devices
- Thin-Film Transistor Technologies
- 2D Materials and Applications
- Graphene research and applications
- Graphene research and applications
- Ferroelectric and Negative Capacitance Devices
- Ferroelectric and Negative Capacitance Devices
- Conducting polymers and applications
- Electronic and Structural Properties of Oxides
- Acoustic Wave Resonator Technologies
- Electronic and Structural Properties of Oxides
- Conducting polymers and applications
- Ferroelectric and Piezoelectric Materials
- Nanowire Synthesis and Applications
- Semiconductor materials and interfaces
- Nanowire Synthesis and Applications
- Ferroelectric and Piezoelectric Materials
- Advanced Power Amplifier Design
- Acoustic Wave Resonator Technologies
- Semiconductor materials and interfaces
- Advanced Power Amplifier Design
- Thermal properties of materials
- Gas Sensing Nanomaterials and Sensors
- Thermal properties of materials
- Quantum and electron transport phenomena
- Gas Sensing Nanomaterials and Sensors
- Quantum and electron transport phenomena
- Nanomaterials and Printing Technologies
- Multiferroics and related materials
- Multiferroics and related materials
- Nanomaterials and Printing Technologies
Keywords (DOAJ)
- electronic devices
- materials science
- electronics
- device engineering
Community confirmations — what users saw in MJL or Scopus Sources; not platform verification and never part of any score.
The journal's record in other sources:Web of Science MJLDOAJ