About the journal
Metrology is an open-access journal published by MDPI AG in Switzerland, publishing in english. It is listed in DOAJ according to the sources read. Declared publication charge: 1,000 CHF. Declared review time at DOAJ: 6 weeks. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.
Basic facts
- Publisher
- MDPI AG
- ISSN
- 2673-8244
- Country
- Switzerland
- Languages
- english
- Access
- Open access
- Declared publication charge
- 1,000 CHF
- Articles in DOAJ
- 200
- Declared review time
- 6 weeks
- Declared peer-review model
- peer_review
- Official website
- https://www.mdpi.com/journal/metrology
Index listings
- DOAJ · 2022-11-16
- Indexing
- DOAJ
- APC
- 1,000 CHF
- Declared review time (DOAJ)
- 6 weeks — journal-declared only (not measured)
- Activity (OpenAlex)
- Active — latest works 2026
- PublishLens list status
- Shown after sign-in
- Counts for promotion at your university?
- Choose your university and rank below ↓
Methodology signals (dated facts from their sources)
Details of the evaluation under the published methodology are shown to signed-in users (free).
Create a free account to view the evaluationJournal profile
Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.
Articles in DOAJ
200
Most recent article
3 months ago
Average review time (journal-declared via DOAJ)
6weeks
Works in OpenAlex
253
Last recorded publication year
2026
h-index
14
i10-index
27
From OpenAlex open data (CC0).
Editorial & policy12
- Last DOAJ review date
- 2023-10-20
- Added to DOAJ
- 2022-11-16
- Declared plagiarism screening
- Declared
- Other fees beyond APC
- No
- Declared digital preservation
- CLOCKSS
- Observed digital preservation (Keepers registry)— snapshot 2026-09-21
- CLOCKSS
- Editorial board
- Official page ↗
- Open references deposited at Crossref
- 99%
- ORCID iDs in current deposits
- 96%
- Enrolled in Crossref Similarity Check
- ✓
- Deposits licence metadata at Crossref
- ✓
- APC waiver policy
- View policy
- Peer-review policy
- View policy
Identity & continuity1
- Source type
- journal
Classification4
Subjects (DOAJ)
LCC codes
Subject areas
- Advanced Measurement and Metrology Techniques
- Advanced Measurement and Metrology Techniques
- Scientific Measurement and Uncertainty Evaluation
- Scientific Measurement and Uncertainty Evaluation
- Optical measurement and interference techniques
- Optical measurement and interference techniques
- Surface Roughness and Optical Measurements
- Surface Roughness and Optical Measurements
Show all subjects (50)
- Sensor Technology and Measurement Systems
- Sensor Technology and Measurement Systems
- Advanced Electrical Measurement Techniques
- Manufacturing Process and Optimization
- Advanced Electrical Measurement Techniques
- Manufacturing Process and Optimization
- Advanced Sensor Technologies Research
- Advanced Sensor Technologies Research
- Advanced machining processes and optimization
- Structural Health Monitoring Techniques
- Advanced machining processes and optimization
- Microwave and Dielectric Measurement Techniques
- Additive Manufacturing and 3D Printing Technologies
- Additive Manufacturing Materials and Processes
- Structural Health Monitoring Techniques
- Additive Manufacturing and 3D Printing Technologies
- Microwave and Dielectric Measurement Techniques
- 3D Surveying and Cultural Heritage
- Additive Manufacturing Materials and Processes
- 3D Surveying and Cultural Heritage
- Advanced Surface Polishing Techniques
- Flow Measurement and Analysis
- Radioactive Decay and Measurement Techniques
- Advanced Surface Polishing Techniques
- Radioactive Decay and Measurement Techniques
- Flow Measurement and Analysis
- Fault Detection and Control Systems
- Fault Detection and Control Systems
- Non-Destructive Testing Techniques
- Pesticide Residue Analysis and Safety
- Pesticide Residue Analysis and Safety
- Non-Destructive Testing Techniques
- Calibration and Measurement Techniques
- Infrastructure Maintenance and Monitoring
- Image Processing Techniques and Applications
- Advanced Fiber Optic Sensors
- Ultrasonics and Acoustic Wave Propagation
- Advanced Fiber Optic Sensors
- Advanced Statistical Process Monitoring
- Calibration and Measurement Techniques
- Infrastructure Maintenance and Monitoring
- Advanced Statistical Process Monitoring
Keywords (DOAJ)
- cyberphysical systems
- machine learning for metrology
- metrology for sustainable manufacturing
- measurement uncertainty in dynamic processes
Community confirmations — what users saw in MJL or Scopus Sources; not platform verification and never part of any score.
The journal's record in other sources:Web of Science MJLDOAJ