About the journal
Light: Advanced Manufacturing is an open-access journal published by Light Publishing Group in China, publishing in english. It is listed in DOAJ according to the sources read. Declared review time at DOAJ: 22 weeks. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.
Basic facts
- Publisher
- Light Publishing Group
- ISSN
- 2689-9620
- Country
- China
- Languages
- english
- Access
- Open access
- Articles in DOAJ
- 220
- Declared review time
- 22 weeks
- Declared peer-review model
- peer_review
- Official website
- https://www.light-am.com
Index listings
- DOAJ · 2022-02-23
- Indexing
- DOAJ
- APC
- —
- Declared review time (DOAJ)
- 22 weeks — journal-declared only (not measured)
- Activity (OpenAlex)
- Active — latest works 2026
- PublishLens list status
- Shown after sign-in
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- Choose your university and rank below ↓
Methodology signals (dated facts from their sources)
Details of the evaluation under the published methodology are shown to signed-in users (free).
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Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.
Articles in DOAJ
220
Most recent article
14 months ago
Average review time (journal-declared via DOAJ)
22weeks
Works in OpenAlex
385
Last recorded publication year
2026
h-index
38
i10-index
124
From OpenAlex open data (CC0).
Editorial & policy9
- Last DOAJ review date
- 2022-02-23
- Added to DOAJ
- 2022-02-23
- Declared plagiarism screening
- Declared
- Other fees beyond APC
- No
- Editorial board
- Official page ↗
- Norwegian register (HK-dir)— 2026
- Level 1 — approved scholarly channel
- Open references deposited at Crossref
- 0%
- ORCID iDs in current deposits
- 0%
- Peer-review policy
- View policy
Identity & continuity2
- Alternate titles
- LAMGuang: xian jin zhi zao
- Source type
- journal
Classification4
Subjects (DOAJ)
LCC codes
Subject areas
- Photonic and Optical Devices
- Photonic and Optical Devices
- Digital Holography and Microscopy
- Laser Material Processing Techniques
- Digital Holography and Microscopy
- Laser Material Processing Techniques
- Optical measurement and interference techniques
- Advanced Optical Imaging Technologies
Show all subjects (50)
- Optical measurement and interference techniques
- Advanced Optical Imaging Technologies
- Nonlinear Optical Materials Studies
- Nonlinear Optical Materials Studies
- Metamaterials and Metasurfaces Applications
- Metamaterials and Metasurfaces Applications
- Plasmonic and Surface Plasmon Research
- Plasmonic and Surface Plasmon Research
- Advanced optical system design
- Advanced optical system design
- Advanced Surface Polishing Techniques
- Advanced Surface Polishing Techniques
- Advanced Fiber Optic Sensors
- Photonic Crystals and Applications
- Advanced Fiber Optic Sensors
- Photonic Crystals and Applications
- Nanofabrication and Lithography Techniques
- Nanofabrication and Lithography Techniques
- Optical Coherence Tomography Applications
- Advanced Fiber Laser Technologies
- Advanced Fiber Laser Technologies
- Optical Coherence Tomography Applications
- Orbital Angular Momentum in Optics
- Orbital Angular Momentum in Optics
- Random lasers and scattering media
- Random lasers and scattering media
- Advanced Fluorescence Microscopy Techniques
- Advanced Fluorescence Microscopy Techniques
- Optical Coatings and Gratings
- Optical Coatings and Gratings
- Near-Field Optical Microscopy
- Surface Roughness and Optical Measurements
- Near-Field Optical Microscopy
- Surface Roughness and Optical Measurements
- Advanced X-ray Imaging Techniques
- Advanced X-ray Imaging Techniques
- Terahertz technology and applications
- Advanced Measurement and Metrology Techniques
- Advanced Measurement and Metrology Techniques
- Terahertz technology and applications
- Perovskite Materials and Applications
- Perovskite Materials and Applications
Keywords (DOAJ)
- advanced manufacturing
- precision instruments
- biomedical technologies
- digital production technologies
- functional surfaces
- nanofabrication
Community confirmations — what users saw in MJL or Scopus Sources; not platform verification and never part of any score.
The journal's record in other sources:Web of Science MJLDOAJ