IEEE Open Journal of the Solid-State Circuits Society

IEEE

Journal websitePeer review: Peer review
Evaluation status available after sign-in

About the journal

IEEE Open Journal of the Solid-State Circuits Society is an open-access journal published by IEEE in United States, publishing in english. It is listed in DOAJ according to the sources read. Declared publication charge: 2,160 USD. Declared review time at DOAJ: 14 weeks. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.

Basic facts

Publisher
IEEE
ISSN
2644-1349
Country
United States
Languages
english
Access
Open access
Declared publication charge
2,160 USD
Articles in DOAJ
167
Declared review time
14 weeks
Declared peer-review model
peer_review

Index listings

  • DOAJ · 2022-06-08
Indexing
DOAJ
APC
2,160 USD
Declared review time (DOAJ)
14 weeks — journal-declared only (not measured)
Activity (OpenAlex)
Active — latest works 2026
PublishLens list status
Shown after sign-in
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Methodology signals (dated facts from their sources)

Details of the evaluation under the published methodology are shown to signed-in users (free).

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Journal profile

Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.

Articles in DOAJ

167

Most recent article

last month

Average review time (journal-declared via DOAJ)

14weeks

Works in OpenAlex

206

Last recorded publication year

2026

Reported by OpenAlex in 2 of 3 sources (CC0 flags, not verified indexing)DOAJSciELOOpenAlex Core

h-index

20

i10-index

46

From OpenAlex open data (CC0).

Editorial & policy12
Last DOAJ review date
2026-03-12
Added to DOAJ
2022-06-08
Declared plagiarism screening
Declared
Other fees beyond APC
No
Declared digital preservation
Portico
Observed digital preservation (Keepers registry)— snapshot 2026-10-05
Portico
Editorial board
Official page ↗
Open references deposited at Crossref
69%
ORCID iDs in current deposits
94%
Enrolled in Crossref Similarity Check
✓
Deposits licence metadata at Crossref
✓
APC waiver policy
View policy
Peer-review policy
View policy
Identity & continuity3
Alternate titles
IOJSBGSolid-State Circuits SocietyOJSSCInstitute of Electrical and Electronics Engineers open journal of the Solid-State Circuits Society
Source type
journal
NLM unique ID (PubMed)
9918317684906676
Classification2

Subjects (DOAJ)

Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks

LCC codes

TK452-454.4

Subject areas

  • Analog and Mixed-Signal Circuit Design
  • Analog and Mixed-Signal Circuit Design
  • Radio Frequency Integrated Circuit Design
  • Radio Frequency Integrated Circuit Design
  • Advancements in PLL and VCO Technologies
  • Advancements in PLL and VCO Technologies
  • Advancements in Semiconductor Devices and Circuit Design
  • Advancements in Semiconductor Devices and Circuit Design
Show all subjects (50)
  • Low-power high-performance VLSI design
  • Advanced Memory and Neural Computing
  • Advanced Memory and Neural Computing
  • Ferroelectric and Negative Capacitance Devices
  • Low-power high-performance VLSI design
  • Ferroelectric and Negative Capacitance Devices
  • Photonic and Optical Devices
  • Photonic and Optical Devices
  • Semiconductor materials and devices
  • Semiconductor materials and devices
  • Energy Harvesting in Wireless Networks
  • CCD and CMOS Imaging Sensors
  • Energy Harvesting in Wireless Networks
  • CCD and CMOS Imaging Sensors
  • Semiconductor Lasers and Optical Devices
  • Semiconductor Lasers and Optical Devices
  • Wireless Power Transfer Systems
  • Wireless Power Transfer Systems
  • Physical Unclonable Functions (PUFs) and Hardware Security
  • Physical Unclonable Functions (PUFs) and Hardware Security
  • Advanced Optical Sensing Technologies
  • Analytical Chemistry and Sensors
  • Analytical Chemistry and Sensors
  • Advanced Optical Sensing Technologies
  • Integrated Circuits and Semiconductor Failure Analysis
  • Advanced DC-DC Converters
  • Neuroscience and Neural Engineering
  • Parallel Computing and Optimization Techniques
  • Microwave Engineering and Waveguides
  • Integrated Circuits and Semiconductor Failure Analysis
  • Microwave Engineering and Waveguides
  • Advanced DC-DC Converters
  • Neuroscience and Neural Engineering
  • Parallel Computing and Optimization Techniques
  • Radiation Effects in Electronics
  • Diverse Scientific and Economic Studies
  • Diverse Scientific and Economic Studies
  • Cryptographic Implementations and Security
  • Radiation Effects in Electronics
  • Cryptographic Implementations and Security
  • Acoustic Wave Resonator Technologies
  • Acoustic Wave Resonator Technologies

Keywords (DOAJ)

  • solid state circuits
  • integrated circuits
  • vlsi design

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The journal's record in other sources:Web of Science MJLDOAJ

Everything shown here is produced automatically from named sources (DOAJ, OpenAlex, Crossref, PubMed, the Norwegian register) as of its capture date, with no human editing. Facts appear as recorded at the source; derived scores (PCI, PTD, PublishLens score) follow a published methodology. Not a judgement on the journal, not an official accreditation, not advice.

Wrong items are corrected automatically by re-reading the source (24 h for daily sources, 7 days for weekly ones) with a dated change log, and each item links to its source record. PublishLens-derived assessments are contested through the appeals mechanism (15 working days). Appeals · Indicator guide

Norwegian register data: Kanalregisteret (HK-dir, Norway) — CC BY 4.0 / NLOD — adapted: level extracted per year · OASPA member list — CC BY

Last automated source read: