About the journal
Advanced Electronic Materials is an open-access journal published by Wiley-VCH in Germany, publishing in english. It is listed in DOAJ according to the sources read. Declared publication charge: 3,920 USD. Declared review time at DOAJ: 10 weeks. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.
Basic facts
- Publisher
- Wiley-VCH
- ISSN
- 2199-160X
- Country
- Germany
- Languages
- english
- Access
- Open access
- Declared publication charge
- 3,920 USD
- Articles in DOAJ
- 1643
- Declared review time
- 10 weeks
- Declared peer-review model
- peer_review
- Official website
- https://onlinelibrary.wiley.com/journal/2199160x
Index listings
- DOAJ · 2023-07-24
- Indexing
- DOAJ
- APC
- 3,920 USD
- Declared review time (DOAJ)
- 10 weeks — journal-declared only (not measured)
- Activity (OpenAlex)
- Active — latest works 2026
- PublishLens list status
- Shown after sign-in
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- Choose your university and rank below ↓
Methodology signals (dated facts from their sources)
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Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.
Articles in DOAJ
1643
Most recent article
last month
Average review time (journal-declared via DOAJ)
10weeks
Works in OpenAlex
4790
Last recorded publication year
2026
h-index
125
i10-index
2464
From OpenAlex open data (CC0).
Editorial & policy13
- Last DOAJ review date
- 2026-03-17
- Added to DOAJ
- 2023-07-24
- Declared plagiarism screening
- Declared
- Other fees beyond APC
- No
- Declared digital preservation
- CLOCKSSPortico
- Observed digital preservation (Keepers registry)— snapshot 2026-10-05
- CLOCKSSPortico
- Editorial board
- Official page ↗
- Norwegian register (HK-dir)— 2026
- Level 1 — approved scholarly channel
- Open references deposited at Crossref
- 85%
- ORCID iDs in current deposits
- 83%
- Enrolled in Crossref Similarity Check
- ✓
- Deposits licence metadata at Crossref
- ✓
- APC waiver policy
- View policy
- Peer-review policy
- View policy
Identity & continuity2
- Source type
- journal
- NLM unique ID (PubMed)
- 101695454
Classification4
Subjects (DOAJ)
LCC codes
Subject areas
- Advanced Memory and Neural Computing
- Advanced Memory and Neural Computing
- Conducting polymers and applications
- Conducting polymers and applications
- Advanced Sensor and Energy Harvesting Materials
- Advanced Sensor and Energy Harvesting Materials
- Organic Electronics and Photovoltaics
- Organic Electronics and Photovoltaics
Show all subjects (50)
- 2D Materials and Applications
- 2D Materials and Applications
- Ferroelectric and Negative Capacitance Devices
- Ferroelectric and Negative Capacitance Devices
- Perovskite Materials and Applications
- Perovskite Materials and Applications
- Semiconductor materials and devices
- Semiconductor materials and devices
- Graphene research and applications
- Graphene research and applications
- Ferroelectric and Piezoelectric Materials
- Ferroelectric and Piezoelectric Materials
- MXene and MAX Phase Materials
- MXene and MAX Phase Materials
- ZnO doping and properties
- ZnO doping and properties
- Thin-Film Transistor Technologies
- Thin-Film Transistor Technologies
- Transition Metal Oxide Nanomaterials
- Transition Metal Oxide Nanomaterials
- Neuroscience and Neural Engineering
- Neuroscience and Neural Engineering
- Multiferroics and related materials
- Multiferroics and related materials
- Electronic and Structural Properties of Oxides
- Electronic and Structural Properties of Oxides
- Advanced Thermoelectric Materials and Devices
- Advanced Thermoelectric Materials and Devices
- Gas Sensing Nanomaterials and Sensors
- Gas Sensing Nanomaterials and Sensors
- Nanowire Synthesis and Applications
- Nanowire Synthesis and Applications
- Organic Light-Emitting Diodes Research
- Organic Light-Emitting Diodes Research
- Magnetic properties of thin films
- Magnetic properties of thin films
- Photoreceptor and optogenetics research
- Photoreceptor and optogenetics research
- Ga2O3 and related materials
- Ga2O3 and related materials
- Chalcogenide Semiconductor Thin Films
- Chalcogenide Semiconductor Thin Films
Keywords (DOAJ)
- electronics
- electronic materials
- magnetic materials
- materials science
- device physics
- organic electronics
Community confirmations — what users saw in MJL or Scopus Sources; not platform verification and never part of any score.
The journal's record in other sources:Web of Science MJLDOAJ