Frontiers in Detector Science and Technology

Frontiers Media S.A.

Journal websitePeer review: Other
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About the journal

Frontiers in Detector Science and Technology is an open-access journal published by Frontiers Media S.A. in Switzerland, publishing in english. It is listed in DOAJ according to the sources read. Declared publication charge: 1,950 CHF. Declared review time at DOAJ: 16 weeks. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.

Basic facts

Publisher
Frontiers Media S.A.
ISSN
2813-8031
Country
Switzerland
Languages
english
Access
Open access
Declared publication charge
1,950 CHF
Articles in DOAJ
9
Declared review time
16 weeks
Declared peer-review model
other

Index listings

  • DOAJ · 2025-08-31
Indexing
DOAJ
APC
1,950 CHF
Declared review time (DOAJ)
16 weeks — journal-declared only (not measured)
Activity (OpenAlex)
Active — latest works 2026
PublishLens list status
Shown after sign-in
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Methodology signals (dated facts from their sources)

Details of the evaluation under the published methodology are shown to signed-in users (free).

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Journal profile

Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.

Articles in DOAJ

9

Most recent article

2 months ago

Average review time (journal-declared via DOAJ)

16weeks

Works in OpenAlex

29

Last recorded publication year

2026

Reported by OpenAlex in 2 of 3 sources (CC0 flags, not verified indexing)DOAJSciELOOpenAlex Core

h-index

5

i10-index

2

From OpenAlex open data (CC0).

Editorial & policy12
Last DOAJ review date
2025-08-31
Added to DOAJ
2025-08-31
Declared plagiarism screening
Declared
Other fees beyond APC
No
Declared digital preservation
CLOCKSS
Observed digital preservation (Keepers registry)— snapshot 2026-10-05
CLOCKSS
Editorial board
Official page ↗
Open references deposited at Crossref
93%
ORCID iDs in current deposits
0%
Enrolled in Crossref Similarity Check
✓
Deposits licence metadata at Crossref
✓
APC waiver policy
View policy
Peer-review policy
View policy
Identity & continuity1
Source type
journal
Classification2

Subjects (DOAJ)

Technology

LCC codes

T

Subject areas

  • Particle Detector Development and Performance
  • Particle Detector Development and Performance
  • Particle Detector Development and Performance
  • Radiation Detection and Scintillator Technologies
  • Advanced Semiconductor Detectors and Materials
  • Radiation Detection and Scintillator Technologies
  • Radiation Detection and Scintillator Technologies
  • Atomic and Subatomic Physics Research
Show all subjects (75)
  • Atomic and Subatomic Physics Research
  • Dark Matter and Cosmic Phenomena
  • Dark Matter and Cosmic Phenomena
  • Particle accelerators and beam dynamics
  • Embedded Systems and FPGA Design
  • Neutrino Physics Research
  • Spectroscopy and Laser Applications
  • Gas Sensing Nanomaterials and Sensors
  • Luminescence Properties of Advanced Materials
  • Nuclear Physics and Applications
  • Quantum, superfluid, helium dynamics
  • Spectroscopy and Laser Applications
  • Photocathodes and Microchannel Plates
  • Gas Sensing Nanomaterials and Sensors
  • Luminescence Properties of Advanced Materials
  • Nuclear Physics and Applications
  • Quantum, superfluid, helium dynamics
  • Radiation Therapy and Dosimetry
  • Advanced Semiconductor Detectors and Materials
  • Analog and Mixed-Signal Circuit Design
  • Perovskite Materials and Applications
  • CCD and CMOS Imaging Sensors
  • Advanced Semiconductor Detectors and Materials
  • Analog and Mixed-Signal Circuit Design
  • Dark Matter and Cosmic Phenomena
  • Medical Imaging Techniques and Applications
  • Perovskite Materials and Applications
  • Perovskite Materials and Applications
  • Photocathodes and Microchannel Plates
  • Particle physics theoretical and experimental studies
  • CCD and CMOS Imaging Sensors
  • Particle physics theoretical and experimental studies
  • Medical Imaging Techniques and Applications
  • IoT Networks and Protocols
  • Wireless Sensor Networks and IoT
  • Low-power high-performance VLSI design
  • Advanced Sensor and Energy Harvesting Materials
  • Radiation Shielding Materials Analysis
  • Diamond and Carbon-based Materials Research
  • Carbon Nanotubes in Composites
  • VLSI and Analog Circuit Testing
  • Medical Imaging Techniques and Applications
  • Advanced X-ray Imaging Techniques
  • Atomic and Molecular Physics
  • Embedded Systems Design Techniques
  • X-ray Spectroscopy and Fluorescence Analysis
  • Radiation Therapy and Dosimetry
  • Diamond and Carbon-based Materials Research
  • Carbon Nanotubes in Composites
  • Low-power high-performance VLSI design
  • High-Energy Particle Collisions Research
  • High-Energy Particle Collisions Research
  • Parallel Computing and Optimization Techniques
  • VLSI and Analog Circuit Testing
  • Embedded Systems Design Techniques
  • Parallel Computing and Optimization Techniques
  • Embedded Systems Design Techniques
  • Embedded Systems and FPGA Applications
  • Advanced Sensor and Energy Harvesting Materials
  • Arduino and IoT Applications
  • Analog and Mixed-Signal Circuit Design
  • Advanced X-ray and CT Imaging
  • Parallel Computing and Optimization Techniques
  • Laser Design and Applications
  • Plasma Diagnostics and Applications
  • Photocathodes and Microchannel Plates
  • CCD and CMOS Imaging Sensors

Keywords (DOAJ)

  • data acquisition methods
  • detector apparatus
  • detector methods
  • detector physics
  • readout electronics
  • materials for detectors

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The journal's record in other sources:Web of Science MJLDOAJ

Everything shown here is produced automatically from named sources (DOAJ, OpenAlex, Crossref, PubMed, the Norwegian register) as of its capture date, with no human editing. Facts appear as recorded at the source; derived scores (PCI, PTD, PublishLens score) follow a published methodology. Not a judgement on the journal, not an official accreditation, not advice.

Wrong items are corrected automatically by re-reading the source (24 h for daily sources, 7 days for weekly ones) with a dated change log, and each item links to its source record. PublishLens-derived assessments are contested through the appeals mechanism (15 working days). Appeals · Indicator guide

Norwegian register data: Kanalregisteret (HK-dir, Norway) — CC BY 4.0 / NLOD — adapted: level extracted per year · OASPA member list — CC BY

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