Beilstein Journal of Nanotechnology

Beilstein-Institut

Journal websitePeer review: Other
Evaluation status available after sign-in

About the journal

Beilstein Journal of Nanotechnology is an open-access journal published by Beilstein-Institut in Germany, publishing in english. It is listed in DOAJ and PUBMED according to the sources read. Declared review time at DOAJ: 23 weeks. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.

Basic facts

Publisher
Beilstein-Institut
ISSN
2190-4286
Country
Germany
Languages
english
Access
Open access
Articles in DOAJ
2702
Declared review time
23 weeks
Declared peer-review model
other

Index listings

  • DOAJ · 2012-06-15
  • PUBMED · 2013-09-13
Indexing
DOAJ · PUBMED
APC
—
Declared review time (DOAJ)
23 weeks — journal-declared only (not measured)
Activity (OpenAlex)
Active — latest works 2026
PublishLens list status
Shown after sign-in
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Methodology signals (dated facts from their sources)

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Journal profile

Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.

Articles in DOAJ

2702

Most recent article

3 months ago

Average review time (journal-declared via DOAJ)

23weeks

Works in OpenAlex

2746

Last recorded publication year

2026

Reported by OpenAlex in 2 of 3 sources (CC0 flags, not verified indexing)DOAJSciELOOpenAlex Core

h-index

96

i10-index

1555

From OpenAlex open data (CC0).

Editorial & policy12
Last DOAJ review date
2026-04-23
Added to DOAJ
2012-06-15
Declared plagiarism screening
Declared
Other fees beyond APC
No
Declared digital preservation
PMC
Observed digital preservation (Keepers registry)— snapshot 2026-10-05
Portico
Editorial board
Official page ↗
Norwegian register (HK-dir)— 2026
Level 1 — approved scholarly channel
Open references deposited at Crossref
100%
ORCID iDs in current deposits
98%
Enrolled in Crossref Similarity Check
✓
Deposits licence metadata at Crossref
✓
Peer-review policy
View policy
Identity & continuity2
Source type
journal
NLM unique ID (PubMed)
101551563
Classification6

Subjects (DOAJ)

Technology: Chemical technologyScience: Physics

LCC codes

TTP1-1185QQC1-999

Subject areas

  • Force Microscopy Techniques and Applications
  • Force Microscopy Techniques and Applications
  • Force Microscopy Techniques and Applications
  • Molecular Junctions and Nanostructures
  • Molecular Junctions and Nanostructures
  • Gold and Silver Nanoparticles Synthesis and Applications
  • Graphene research and applications
  • Graphene research and applications
Show all subjects (75)
  • Graphene research and applications
  • Gold and Silver Nanoparticles Synthesis and Applications
  • Gold and Silver Nanoparticles Synthesis and Applications
  • Nanoparticle-Based Drug Delivery
  • Surface Chemistry and Catalysis
  • Molecular Junctions and Nanostructures
  • Mechanical and Optical Resonators
  • Mechanical and Optical Resonators
  • Nanofabrication and Lithography Techniques
  • Nanoparticles: synthesis and applications
  • TiO2 Photocatalysis and Solar Cells
  • Plasmonic and Surface Plasmon Research
  • Advanced Photocatalysis Techniques
  • Advanced Photocatalysis Techniques
  • Quantum Dots Synthesis And Properties
  • Quantum Dots Synthesis And Properties
  • Advanced Photocatalysis Techniques
  • Nanoparticle-Based Drug Delivery
  • Nanoparticle-Based Drug Delivery
  • Nanoparticles: synthesis and applications
  • Nanoparticles: synthesis and applications
  • Gas Sensing Nanomaterials and Sensors
  • Gas Sensing Nanomaterials and Sensors
  • Carbon Nanotubes in Composites
  • Carbon Nanotubes in Composites
  • 2D Materials and Applications
  • ZnO doping and properties
  • ZnO doping and properties
  • Advanced MEMS and NEMS Technologies
  • Adhesion, Friction, and Surface Interactions
  • Advanced biosensing and bioanalysis techniques
  • Advanced biosensing and bioanalysis techniques
  • Surface and Thin Film Phenomena
  • ZnO doping and properties
  • Adhesion, Friction, and Surface Interactions
  • Ion-surface interactions and analysis
  • Ion-surface interactions and analysis
  • Adhesion, Friction, and Surface Interactions
  • Carbon Nanotubes in Composites
  • Advanced Electron Microscopy Techniques and Applications
  • Advanced Electron Microscopy Techniques and Applications
  • Surface and Thin Film Phenomena
  • Surface and Thin Film Phenomena
  • Near-Field Optical Microscopy
  • Near-Field Optical Microscopy
  • TiO2 Photocatalysis and Solar Cells
  • TiO2 Photocatalysis and Solar Cells
  • Quantum and electron transport phenomena
  • Quantum and electron transport phenomena
  • Magnetic properties of thin films
  • Quantum and electron transport phenomena
  • Nanowire Synthesis and Applications
  • Nanowire Synthesis and Applications
  • Nanowire Synthesis and Applications
  • Copper-based nanomaterials and applications
  • Copper-based nanomaterials and applications
  • Quantum Dots Synthesis And Properties
  • Semiconductor materials and devices
  • Semiconductor materials and devices
  • Surface Modification and Superhydrophobicity
  • Plasmonic and Surface Plasmon Research
  • Characterization and Applications of Magnetic Nanoparticles
  • Plasmonic and Surface Plasmon Research
  • Advancements in Battery Materials
  • Advancements in Battery Materials
  • Electrocatalysts for Energy Conversion
  • Catalytic Processes in Materials Science

Keywords (DOAJ)

  • nanoscience
  • nanotechnology

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Everything shown here is produced automatically from named sources (DOAJ, OpenAlex, Crossref, PubMed, the Norwegian register) as of its capture date, with no human editing. Facts appear as recorded at the source; derived scores (PCI, PTD, PublishLens score) follow a published methodology. Not a judgement on the journal, not an official accreditation, not advice.

Wrong items are corrected automatically by re-reading the source (24 h for daily sources, 7 days for weekly ones) with a dated change log, and each item links to its source record. PublishLens-derived assessments are contested through the appeals mechanism (15 working days). Appeals · Indicator guide

Norwegian register data: Kanalregisteret (HK-dir, Norway) — CC BY 4.0 / NLOD — adapted: level extracted per year · OASPA member list — CC BY

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