Advanced Devices & Instrumentation

American Association for the Advancement of Science (AAAS)

Journal websitePeer review: Other
Evaluation status available after sign-in

About the journal

Advanced Devices & Instrumentation is an open-access journal published by American Association for the Advancement of Science (AAAS) in United States, publishing in english. It is listed in DOAJ according to the sources read. Declared review time at DOAJ: 23 weeks. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.

Basic facts

Publisher
American Association for the Advancement of Science (AAAS)
ISSN
2767-9713
Country
United States
Languages
english
Access
Open access
Articles in DOAJ
118
Declared review time
23 weeks
Declared peer-review model
other

Index listings

  • DOAJ · 2022-09-22
Indexing
DOAJ
APC
—
Declared review time (DOAJ)
23 weeks — journal-declared only (not measured)
Activity (OpenAlex)
Active — latest works 2026
PublishLens list status
Shown after sign-in
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Methodology signals (dated facts from their sources)

Details of the evaluation under the published methodology are shown to signed-in users (free).

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Journal profile

Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.

Articles in DOAJ

118

Most recent article

last month

Average review time (journal-declared via DOAJ)

23weeks

Works in OpenAlex

117

Last recorded publication year

2026

Reported by OpenAlex in 2 of 3 sources (CC0 flags, not verified indexing)DOAJSciELOOpenAlex Core

h-index

19

i10-index

37

From OpenAlex open data (CC0).

Editorial & policy11
Last DOAJ review date
2022-09-22
Added to DOAJ
2022-09-22
Declared plagiarism screening
Declared
Other fees beyond APC
No
Observed digital preservation (Keepers registry)— snapshot 2026-10-05
Portico
Editorial board
Official page ↗
Open references deposited at Crossref
96%
ORCID iDs in current deposits
79%
Enrolled in Crossref Similarity Check
✓
APC waiver policy
View policy
Peer-review policy
View policy
Identity & continuity3
Alternate titles
ADIAdvanced devices and instrumentation
Source type
journal
NLM unique ID (PubMed)
9919228057306676
Classification4

Subjects (DOAJ)

Technology: Electrical engineering. Electronics. Nuclear engineering: ElectronicsTechnology: Engineering (General). Civil engineering (General): Applied optics. Photonics

LCC codes

TK7800-8360TA1501-1820

Subject areas

  • Metamaterials and Metasurfaces Applications
  • Photonic and Optical Devices
  • Photonic and Optical Devices
  • Advanced Fiber Optic Sensors
  • Advanced Fiber Optic Sensors
  • Optical measurement and interference techniques
  • Advanced Sensor and Energy Harvesting Materials
  • Metamaterials and Metasurfaces Applications
Show all subjects (75)
  • Metamaterials and Metasurfaces Applications
  • Advanced Fiber Optic Sensors
  • Photonic and Optical Devices
  • Ultrasonics and Acoustic Wave Propagation
  • 2D Materials and Applications
  • Advanced Sensor and Energy Harvesting Materials
  • Conducting polymers and applications
  • Conducting polymers and applications
  • Advanced Sensor and Energy Harvesting Materials
  • Graphene research and applications
  • Organic Electronics and Photovoltaics
  • Acoustic Wave Phenomena Research
  • Random lasers and scattering media
  • Advanced Fiber Laser Technologies
  • Quantum Information and Cryptography
  • Perovskite Materials and Applications
  • Advanced Semiconductor Detectors and Materials
  • Digital Holography and Microscopy
  • Optical measurement and interference techniques
  • Optical measurement and interference techniques
  • Perovskite Materials and Applications
  • Mechanical and Optical Resonators
  • Advanced Fiber Laser Technologies
  • Mechanical and Optical Resonators
  • Advanced Optical Sensing Technologies
  • Analytical Chemistry and Sensors
  • Neural Networks and Reservoir Computing
  • Ultrasound and Hyperthermia Applications
  • Advanced Antenna and Metasurface Technologies
  • Graphene research and applications
  • Photonic Crystals and Applications
  • Advanced Fluorescence Microscopy Techniques
  • Analytical Chemistry and Sensors
  • Neural Networks and Reservoir Computing
  • Advanced Antenna and Metasurface Technologies
  • Ultrasound and Hyperthermia Applications
  • Advanced Antenna and Metasurface Technologies
  • Photonic Crystal and Fiber Optics
  • Advanced Photonic Communication Systems
  • Structural Health Monitoring Techniques
  • Plasmonic and Surface Plasmon Research
  • Perovskite Materials and Applications
  • Graphene research and applications
  • Photonic Crystals and Applications
  • Advanced Fluorescence Microscopy Techniques
  • Plasmonic and Surface Plasmon Research
  • Industrial Vision Systems and Defect Detection
  • Quantum Information and Cryptography
  • Quantum Information and Cryptography
  • 2D Materials and Applications
  • Advanced Optical Sensing Technologies
  • Thermal properties of materials
  • Digital Holography and Microscopy
  • Optical Imaging and Spectroscopy Techniques
  • 2D Materials and Applications
  • Image Processing Techniques and Applications
  • Optical Imaging and Spectroscopy Techniques
  • Antenna Design and Analysis
  • Advanced Optical Sensing Technologies
  • Digital Holography and Microscopy
  • Industrial Vision Systems and Defect Detection
  • Plasmonic and Surface Plasmon Research
  • Magnetic properties of thin films
  • Advanced X-ray Imaging Techniques
  • Advanced Memory and Neural Computing
  • Image Processing Techniques and Applications
  • Antenna Design and Analysis

Keywords (DOAJ)

  • electronics
  • photonics
  • instrumentation
  • advanced devices
  • system integration
  • optoelectronics

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The journal's record in other sources:Web of Science MJLDOAJ

Everything shown here is produced automatically from named sources (DOAJ, OpenAlex, Crossref, PubMed, the Norwegian register) as of its capture date, with no human editing. Facts appear as recorded at the source; derived scores (PCI, PTD, PublishLens score) follow a published methodology. Not a judgement on the journal, not an official accreditation, not advice.

Wrong items are corrected automatically by re-reading the source (24 h for daily sources, 7 days for weekly ones) with a dated change log, and each item links to its source record. PublishLens-derived assessments are contested through the appeals mechanism (15 working days). Appeals · Indicator guide

Norwegian register data: Kanalregisteret (HK-dir, Norway) — CC BY 4.0 / NLOD — adapted: level extracted per year · OASPA member list — CC BY

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