Технологія та конструювання в електронній апаратурі
Politekhperiodika
About the journal
Технологія та конструювання в електронній апаратурі is an open-access journal published by Politekhperiodika in Ukraine, publishing in ENGLISH and UKRAINIAN. It is listed in DOAJ according to the sources read. Declared review time at DOAJ: 6 weeks. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.
Basic facts
- Publisher
- Politekhperiodika
- ISSN
- 3083-6530 · 3083-6549
- Country
- Ukraine
- Languages
- ENGLISH, UKRAINIAN
- Access
- Open access
- Articles in DOAJ
- 943
- Declared review time
- 6 weeks
- Declared peer-review model
- double_blind
- Official website
- https://tkea.com.ua/index.php/journal
Index listings
- DOAJ · 2025-08-26
- Indexing
- DOAJ
- APC
- —
- Declared review time (DOAJ)
- 6 weeks — journal-declared only (not measured)
- Activity (OpenAlex)
- Active — latest works 2025
- PublishLens list status
- Shown after sign-in
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- Choose your university and rank below ↓
Methodology signals (dated facts from their sources)
Details of the evaluation under the published methodology are shown to signed-in users (free).
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Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.
Articles in DOAJ
943
Most recent article
last month
Average review time (journal-declared via DOAJ)
6weeks
Works in OpenAlex
21
Last recorded publication year
2025
h-index
1
i10-index
0
From OpenAlex open data (CC0).
Editorial & policy9
- Last DOAJ review date
- 2025-08-26
- Added to DOAJ
- 2025-08-26
- Declared plagiarism screening
- Declared
- Other fees beyond APC
- No
- Editorial board
- Official page ↗
- Open references deposited at Crossref
- 88%
- ORCID iDs in current deposits
- 84%
- Enrolled in Crossref Similarity Check
- ✓
- Deposits licence metadata at Crossref
- ✓
- Peer-review policy
- View policy
Identity & continuity2
- Continues
- 2309-9992, 2225-5818
- Source type
- journal
Classification4
Subjects (DOAJ)
LCC codes
Subject areas
- Photovoltaic System Optimization Techniques
- Photovoltaic System Optimization Techniques
- Wireless Signal Modulation Classification
- Non-Destructive Testing Techniques
- Wireless Signal Modulation Classification
- Non-Destructive Testing Techniques
- Advanced Battery Technologies Research
- Heat Transfer and Boiling Studies
Show all subjects (50)
- Electrical and Bioimpedance Tomography
- Distributed Sensor Networks and Detection Algorithms
- Radar Systems and Signal Processing
- Heat Transfer and Optimization
- Chalcogenide Semiconductor Thin Films
- Silicon and Solar Cell Technologies
- Semiconductor materials and interfaces
- Distributed Sensor Networks and Detection Algorithms
- Heat Transfer and Boiling Studies
- Advanced Battery Technologies Research
- Silicon and Solar Cell Technologies
- Chalcogenide Semiconductor Thin Films
- Electrical and Bioimpedance Tomography
- Heat Transfer and Optimization
- Radar Systems and Signal Processing
- Semiconductor materials and interfaces
- Quantum Dots Synthesis And Properties
- Multilevel Inverters and Converters
- Wireless Communication Networks Research
- High voltage insulation and dielectric phenomena
- Microgrid Control and Optimization
- Wireless Communication Networks Research
- GNSS positioning and interference
- Thin-Film Transistor Technologies
- Power Quality and Harmonics
- Advanced MEMS and NEMS Technologies
- Advanced Sensor and Energy Harvesting Materials
- Multilevel Inverters and Converters
- Microgrid Control and Optimization
- Advanced Fiber Optic Sensors
- Advanced DC-DC Converters
- ZnO doping and properties
- Advanced MEMS and NEMS Technologies
- Power Quality and Harmonics
- Thin-Film Transistor Technologies
- GNSS positioning and interference
- Advanced Sensor and Energy Harvesting Materials
- Advanced DC-DC Converters
- Advanced Fiber Optic Sensors
- ZnO doping and properties
- Quantum Dots Synthesis And Properties
- High voltage insulation and dielectric phenomena
Keywords (DOAJ)
- electronics
- electrical engineering
- bioengineering
- microelectronics
- semiconductors
Community confirmations — what users saw in MJL or Scopus Sources; not platform verification and never part of any score.
The journal's record in other sources:Web of Science MJLDOAJ