About the journal
Surface and Interface Analysis is a journal published by Wiley in United States. It is listed in PUBMED according to the sources read. Declared publication charge: 3,350 USD. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.
Basic facts
- Publisher
- Wiley
- ISSN
- 0142-2421 · 1096-9918
- Country
- United States
- Access
- Not open access / not declared
- Declared publication charge
- 3,350 USD
- Declared peer-review model
- peer_review
Index listings
- PUBMED · 2009-03-18
- Indexing
- PUBMED
- APC
- 3,350 USD
- Declared review time (DOAJ)
- —
- Activity (OpenAlex)
- Active — latest works 2026
- PublishLens list status
- Shown after sign-in
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Methodology signals (dated facts from their sources)
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Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.
Works in OpenAlex
10118
Last recorded publication year
2026
h-index
139
i10-index
4064
From OpenAlex open data (CC0).
Editorial & policy5
- Observed digital preservation (Keepers registry)— snapshot 2026-10-05
- CLOCKSSPortico
- Norwegian register (HK-dir)— 2026
- Level 1 — approved scholarly channel
- Open references deposited at Crossref
- 78%
- ORCID iDs in current deposits
- 75%
- Enrolled in Crossref Similarity Check
- ✓
- Deposits licence metadata at Crossref
- ✓
Identity & continuity2
- Alternate titles
- SIA. surf. interface anal.SIA
- Source type
- journal
Classification(no data)
No data available to the platform for this group
No platform data for: Classification — absence is not a judgment about the journal.
Subject areas
- Electron and X-Ray Spectroscopy Techniques
- Electron and X-Ray Spectroscopy Techniques
- Ion-surface interactions and analysis
- Ion-surface interactions and analysis
- Semiconductor materials and devices
- Semiconductor materials and devices
- X-ray Spectroscopy and Fluorescence Analysis
- X-ray Spectroscopy and Fluorescence Analysis
Show all subjects (50)
- Metal and Thin Film Mechanics
- Metal and Thin Film Mechanics
- Integrated Circuits and Semiconductor Failure Analysis
- Integrated Circuits and Semiconductor Failure Analysis
- Corrosion Behavior and Inhibition
- Corrosion Behavior and Inhibition
- Diamond and Carbon-based Materials Research
- Diamond and Carbon-based Materials Research
- Surface and Thin Film Phenomena
- Surface and Thin Film Phenomena
- Force Microscopy Techniques and Applications
- Force Microscopy Techniques and Applications
- Catalytic Processes in Materials Science
- Catalytic Processes in Materials Science
- Analytical chemistry methods development
- Analytical chemistry methods development
- Electronic and Structural Properties of Oxides
- Electronic and Structural Properties of Oxides
- Advancements in Photolithography Techniques
- Advancements in Photolithography Techniques
- Surface Modification and Superhydrophobicity
- Surface Modification and Superhydrophobicity
- Surface Roughness and Optical Measurements
- Surface Roughness and Optical Measurements
- Adhesion, Friction, and Surface Interactions
- Adhesion, Friction, and Surface Interactions
- Advanced Materials Characterization Techniques
- Advanced Materials Characterization Techniques
- ZnO doping and properties
- ZnO doping and properties
- Molecular Junctions and Nanostructures
- Molecular Junctions and Nanostructures
- Mass Spectrometry Techniques and Applications
- Mass Spectrometry Techniques and Applications
- Semiconductor materials and interfaces
- Semiconductor materials and interfaces
- Theoretical and Computational Physics
- Theoretical and Computational Physics
- Anodic Oxide Films and Nanostructures
- Anodic Oxide Films and Nanostructures
- Hydrogen embrittlement and corrosion behaviors in metals
- Hydrogen embrittlement and corrosion behaviors in metals
Community confirmations — what users saw in MJL or Scopus Sources; not platform verification and never part of any score.
The journal's record in other sources:Web of Science MJLDOAJ