About the journal
Thin Solid Films is a journal published by Elsevier BV in Netherlands. It is listed in PUBMED according to the sources read. Declared publication charge: 2,890 USD. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.
Basic facts
- Publisher
- Elsevier BV
- ISSN
- 1879-2731 · 0040-6090
- Country
- Netherlands
- Access
- Not open access / not declared
- Declared publication charge
- 2,890 USD
- Declared peer-review model
- peer_review
- Official website
- http://www.journals.elsevier.com/thin-solid-films/
Index listings
- PUBMED · 1998-08-31
- Indexing
- PUBMED
- APC
- 2,890 USD
- Declared review time (DOAJ)
- —
- Activity (OpenAlex)
- Active — latest works 2026
- PublishLens list status
- Shown after sign-in
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Methodology signals (dated facts from their sources)
Details of the evaluation under the published methodology are shown to signed-in users (free).
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Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.
Works in OpenAlex
47350
Last recorded publication year
2026
h-index
253
i10-index
26361
From OpenAlex open data (CC0).
Editorial & policy4
- Observed digital preservation (Keepers registry)— snapshot 2026-10-05
- CLOCKSSPortico
- Norwegian register (HK-dir)— 2026
- Level 1 — approved scholarly channel
- Open references deposited at Crossref
- 96%
- ORCID iDs in current deposits
- 88%
- Deposits licence metadata at Crossref
- ✓
Identity & continuity2
- Source type
- journal
- NLM unique ID (PubMed)
- 101462246
Classification(no data)
No data available to the platform for this group
No platform data for: Classification — absence is not a judgment about the journal.
Subject areas
- Semiconductor materials and devices
- Semiconductor materials and devices
- Metal and Thin Film Mechanics
- Metal and Thin Film Mechanics
- ZnO doping and properties
- ZnO doping and properties
- Thin-Film Transistor Technologies
- Thin-Film Transistor Technologies
Show all subjects (50)
- Diamond and Carbon-based Materials Research
- Diamond and Carbon-based Materials Research
- Chalcogenide Semiconductor Thin Films
- Chalcogenide Semiconductor Thin Films
- Semiconductor materials and interfaces
- Semiconductor materials and interfaces
- Copper Interconnects and Reliability
- Copper Interconnects and Reliability
- Quantum Dots Synthesis And Properties
- Quantum Dots Synthesis And Properties
- Silicon Nanostructures and Photoluminescence
- Silicon Nanostructures and Photoluminescence
- Gas Sensing Nanomaterials and Sensors
- Gas Sensing Nanomaterials and Sensors
- Copper-based nanomaterials and applications
- Copper-based nanomaterials and applications
- Silicon and Solar Cell Technologies
- Silicon and Solar Cell Technologies
- Electronic and Structural Properties of Oxides
- Electronic and Structural Properties of Oxides
- Transition Metal Oxide Nanomaterials
- Transition Metal Oxide Nanomaterials
- Ion-surface interactions and analysis
- Ion-surface interactions and analysis
- Conducting polymers and applications
- Conducting polymers and applications
- Organic Electronics and Photovoltaics
- Organic Electronics and Photovoltaics
- Surface and Thin Film Phenomena
- Surface and Thin Film Phenomena
- Semiconductor Quantum Structures and Devices
- Semiconductor Quantum Structures and Devices
- Ga2O3 and related materials
- Ga2O3 and related materials
- GaN-based semiconductor devices and materials
- GaN-based semiconductor devices and materials
- Molecular Junctions and Nanostructures
- Molecular Junctions and Nanostructures
- Ferroelectric and Piezoelectric Materials
- Ferroelectric and Piezoelectric Materials
- Force Microscopy Techniques and Applications
- Force Microscopy Techniques and Applications
Community confirmations — what users saw in MJL or Scopus Sources; not platform verification and never part of any score.
The journal's record in other sources:Web of Science MJLDOAJ