About the journal
Microelectronic Engineering is a journal published by Elsevier BV in Netherlands. It is listed in PUBMED according to the sources read. Declared publication charge: 2,750 USD. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.
Basic facts
- Publisher
- Elsevier BV
- ISSN
- 1873-5568 · 0167-9317
- Country
- Netherlands
- Access
- Not open access / not declared
- Declared publication charge
- 2,750 USD
- Declared peer-review model
- peer_review
- Official website
- https://www.journals.elsevier.com/microelectronic-engineering
Index listings
- PUBMED · 2012-10-01
- Indexing
- PUBMED
- APC
- 2,750 USD
- Declared review time (DOAJ)
- —
- Activity (OpenAlex)
- Active — latest works 2026
- PublishLens list status
- Shown after sign-in
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Methodology signals (dated facts from their sources)
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Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.
Works in OpenAlex
14093
Last recorded publication year
2026
h-index
121
i10-index
5847
From OpenAlex open data (CC0).
Editorial & policy4
- Observed digital preservation (Keepers registry)— snapshot 2026-10-05
- CLOCKSSPortico
- Norwegian register (HK-dir)— 2026
- Level 1 — approved scholarly channel
- Open references deposited at Crossref
- 90%
- ORCID iDs in current deposits
- 8%
- Deposits licence metadata at Crossref
- ✓
Identity & continuity1
- Source type
- journal
Classification(no data)
No data available to the platform for this group
No platform data for: Classification — absence is not a judgment about the journal.
Subject areas
- Semiconductor materials and devices
- Semiconductor materials and devices
- Advancements in Photolithography Techniques
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Advancements in Semiconductor Devices and Circuit Design
Show all subjects (50)
- Nanofabrication and Lithography Techniques
- Nanofabrication and Lithography Techniques
- Advanced Surface Polishing Techniques
- Advanced Surface Polishing Techniques
- Copper Interconnects and Reliability
- Copper Interconnects and Reliability
- Semiconductor materials and interfaces
- Semiconductor materials and interfaces
- Electron and X-Ray Spectroscopy Techniques
- Electron and X-Ray Spectroscopy Techniques
- Force Microscopy Techniques and Applications
- Force Microscopy Techniques and Applications
- Metal and Thin Film Mechanics
- Metal and Thin Film Mechanics
- Nanowire Synthesis and Applications
- Nanowire Synthesis and Applications
- Optical Coatings and Gratings
- Optical Coatings and Gratings
- 3D IC and TSV technologies
- 3D IC and TSV technologies
- Photonic and Optical Devices
- Photonic and Optical Devices
- Ferroelectric and Negative Capacitance Devices
- Ferroelectric and Negative Capacitance Devices
- Semiconductor Quantum Structures and Devices
- Silicon and Solar Cell Technologies
- Silicon and Solar Cell Technologies
- Semiconductor Quantum Structures and Devices
- Microfluidic and Capillary Electrophoresis Applications
- Advanced Memory and Neural Computing
- Microfluidic and Capillary Electrophoresis Applications
- Advanced Memory and Neural Computing
- Thin-Film Transistor Technologies
- Thin-Film Transistor Technologies
- Advanced MEMS and NEMS Technologies
- Advanced MEMS and NEMS Technologies
- Diverse Scientific and Economic Studies
- Diverse Scientific and Economic Studies
- Electronic Packaging and Soldering Technologies
- Electronic Packaging and Soldering Technologies
- Silicon Nanostructures and Photoluminescence
- Silicon Nanostructures and Photoluminescence
Community confirmations — what users saw in MJL or Scopus Sources; not platform verification and never part of any score.
The journal's record in other sources:Web of Science MJLDOAJ