Surface Science

Elsevier BV

Journal websitePeer review: Peer review
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About the journal

Surface Science is a journal published by Elsevier BV in Netherlands. It is listed in PUBMED according to the sources read. Declared publication charge: 3,120 USD. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.

Basic facts

Publisher
Elsevier BV
ISSN
1879-2758 · 0039-6028
Country
Netherlands
Access
Not open access / not declared
Declared publication charge
3,120 USD
Declared peer-review model
peer_review

Index listings

  • PUBMED · 2008-04-01
Indexing
PUBMED
APC
3,120 USD
Declared review time (DOAJ)
—
Activity (OpenAlex)
Active — latest works 2026
PublishLens list status
Shown after sign-in
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Methodology signals (dated facts from their sources)

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Journal profile

Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.

Works in OpenAlex

39570

Last recorded publication year

2026

Reported by OpenAlex in 1 of 3 sources (CC0 flags, not verified indexing)DOAJSciELOOpenAlex Core

h-index

268

i10-index

24282

From OpenAlex open data (CC0).

Editorial & policy4
Observed digital preservation (Keepers registry)— snapshot 2026-09-21
CLOCKSSPortico
Norwegian register (HK-dir)— 2026
Level 1 — approved scholarly channel
Open references deposited at Crossref
91%
ORCID iDs in current deposits
88%
Deposits licence metadata at Crossref
✓
Identity & continuity1
Source type
journal
Classification(no data)

No data available to the platform for this group

No platform data for: Classification — absence is not a judgment about the journal.

Subject areas

  • Advanced Chemical Physics Studies
  • Advanced Chemical Physics Studies
  • Surface and Thin Film Phenomena
  • Surface and Thin Film Phenomena
  • Electron and X-Ray Spectroscopy Techniques
  • Electron and X-Ray Spectroscopy Techniques
  • Catalytic Processes in Materials Science
  • Catalytic Processes in Materials Science
Show all subjects (50)
  • nanoparticles nucleation surface interactions
  • nanoparticles nucleation surface interactions
  • Semiconductor materials and devices
  • Semiconductor materials and devices
  • Molecular Junctions and Nanostructures
  • Molecular Junctions and Nanostructures
  • Ion-surface interactions and analysis
  • Ion-surface interactions and analysis
  • Advanced Materials Characterization Techniques
  • Advanced Materials Characterization Techniques
  • Semiconductor Quantum Structures and Devices
  • Semiconductor Quantum Structures and Devices
  • Quantum and electron transport phenomena
  • Quantum and electron transport phenomena
  • Electronic and Structural Properties of Oxides
  • Electronic and Structural Properties of Oxides
  • Semiconductor materials and interfaces
  • Semiconductor materials and interfaces
  • Spectroscopy and Quantum Chemical Studies
  • Spectroscopy and Quantum Chemical Studies
  • Catalysis and Oxidation Reactions
  • Catalysis and Oxidation Reactions
  • Force Microscopy Techniques and Applications
  • Force Microscopy Techniques and Applications
  • Quantum, superfluid, helium dynamics
  • Quantum, superfluid, helium dynamics
  • Magnetic properties of thin films
  • Magnetic properties of thin films
  • Theoretical and Computational Physics
  • Theoretical and Computational Physics
  • Graphene research and applications
  • Graphene research and applications
  • Physics of Superconductivity and Magnetism
  • Physics of Superconductivity and Magnetism
  • Surface Chemistry and Catalysis
  • Surface Chemistry and Catalysis
  • Chemical and Physical Properties of Materials
  • Chemical and Physical Properties of Materials
  • Metal and Thin Film Mechanics
  • ZnO doping and properties
  • ZnO doping and properties
  • Metal and Thin Film Mechanics

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The journal's record in other sources:Web of Science MJLDOAJ

Everything shown here is produced automatically from named sources (DOAJ, OpenAlex, Crossref, PubMed, the Norwegian register) as of its capture date, with no human editing. Facts appear as recorded at the source; derived scores (PCI, PTD, PublishLens score) follow a published methodology. Not a judgement on the journal, not an official accreditation, not advice.

Wrong items are corrected automatically by re-reading the source (24 h for daily sources, 7 days for weekly ones) with a dated change log, and each item links to its source record. PublishLens-derived assessments are contested through the appeals mechanism (15 working days). Appeals · Indicator guide

Norwegian register data: Kanalregisteret (HK-dir, Norway) — CC BY 4.0 / NLOD — adapted: level extracted per year · OASPA member list — CC BY

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