About the journal
Microscopy is a journal published by Oxford University Press in United Kingdom. It is listed in MEDLINE and PUBMED according to the sources read. Declared publication charge: 3,200 USD. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.
Basic facts
- Publisher
- Oxford University Press
- ISSN
- 2050-5698 · 2050-5701
- Country
- United Kingdom
- Access
- Not open access / not declared
- Declared publication charge
- 3,200 USD
- Official website
- https://academic.oup.com/jmicro
Index listings
- MEDLINE · 2013-01-01
- PUBMED · 2017-02-08
- Indexing
- MEDLINE · PUBMED
- APC
- 3,200 USD
- Declared review time (DOAJ)
- —
- Actual review time (measured)
- 98 days received→accepted — computed from PubMed (n=96)
- Activity (OpenAlex)
- Active — latest works 2026
- PublishLens list status
- Shown after sign-in
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Methodology signals (dated facts from their sources)
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Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.
Works in OpenAlex
1714
Last recorded publication year
2026
h-index
48
i10-index
350
From OpenAlex open data (CC0).
Editorial & policy5
- Observed digital preservation (Keepers registry)— snapshot 2026-10-05
- CLOCKSSPortico
- Norwegian register (HK-dir)— 2026
- Level 1 — approved scholarly channel
- Open references deposited at Crossref
- 88%
- ORCID iDs in current deposits
- 60%
- Enrolled in Crossref Similarity Check
- ✓
- Deposits licence metadata at Crossref
- ✓
Identity & continuity2
- Source type
- journal
- NLM unique ID (PubMed)
- 101595834
Classification(no data)
No data available to the platform for this group
No platform data for: Classification — absence is not a judgment about the journal.
Subject areas
- Advanced Electron Microscopy Techniques and Applications
- Advanced Electron Microscopy Techniques and Applications
- Electron and X-Ray Spectroscopy Techniques
- Electron and X-Ray Spectroscopy Techniques
- Force Microscopy Techniques and Applications
- Force Microscopy Techniques and Applications
- Advanced Fluorescence Microscopy Techniques
- Advanced Fluorescence Microscopy Techniques
Show all subjects (50)
- Advanced X-ray Imaging Techniques
- Advanced X-ray Imaging Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Integrated Circuits and Semiconductor Failure Analysis
- Diverse Scientific and Economic Studies
- Diverse Scientific and Economic Studies
- Earthquake and Disaster Impact Studies
- Earthquake and Disaster Impact Studies
- Nanofabrication and Lithography Techniques
- Nanofabrication and Lithography Techniques
- Advanced Materials Characterization Techniques
- Ion-surface interactions and analysis
- Advanced Materials Characterization Techniques
- Ion-surface interactions and analysis
- Cell Image Analysis Techniques
- Cell Image Analysis Techniques
- Advancements in Photolithography Techniques
- Advancements in Photolithography Techniques
- Microstructure and mechanical properties
- Microstructure and mechanical properties
- Photosynthetic Processes and Mechanisms
- X-ray Spectroscopy and Fluorescence Analysis
- Photosynthetic Processes and Mechanisms
- X-ray Spectroscopy and Fluorescence Analysis
- Near-Field Optical Microscopy
- Near-Field Optical Microscopy
- Surface and Thin Film Phenomena
- Semiconductor materials and devices
- Semiconductor materials and devices
- Surface and Thin Film Phenomena
- Advancements in Battery Materials
- Advancements in Battery Materials
- Magnetic properties of thin films
- Magnetic properties of thin films
- Aluminum Alloy Microstructure Properties
- Aluminum Alloy Microstructure Properties
- Hydrogen embrittlement and corrosion behaviors in metals
- Electronic and Structural Properties of Oxides
- Electronic and Structural Properties of Oxides
- Hydrogen embrittlement and corrosion behaviors in metals
- Microstructure and Mechanical Properties of Steels
- Microstructure and Mechanical Properties of Steels
Community confirmations — what users saw in MJL or Scopus Sources; not platform verification and never part of any score.
The journal's record in other sources:Web of Science MJLDOAJ