About the journal
Microscopy and Microanalysis is a journal published by Oxford University Press in United States. It is listed in MEDLINE and PUBMED according to the sources read. Declared publication charge: 3,255 USD. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.
Basic facts
- Publisher
- Oxford University Press
- ISSN
- 1431-9276 · 1435-8115
- Country
- United States
- Access
- Not open access / not declared
- Declared publication charge
- 3,255 USD
- Official website
- https://academic.oup.com/mam
Index listings
- MEDLINE · 2002-01-01
- PUBMED · 2010-09-02
- Indexing
- MEDLINE · PUBMED
- APC
- 3,255 USD
- Declared review time (DOAJ)
- —
- Actual review time (measured)
- 144 days received→accepted — computed from PubMed (n=96)
- Activity (OpenAlex)
- Active — latest works 2026
- PublishLens list status
- Shown after sign-in
- Counts for promotion at your university?
- Choose your university and rank below ↓
Methodology signals (dated facts from their sources)
Details of the evaluation under the published methodology are shown to signed-in users (free).
Create a free account to view the evaluationJournal profile
Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.
Works in OpenAlex
33084
Last recorded publication year
2026
h-index
94
i10-index
2143
From OpenAlex open data (CC0).
Editorial & policy5
- Observed digital preservation (Keepers registry)— snapshot 2026-10-05
- CLOCKSSPortico
- Norwegian register (HK-dir)— 2026
- Level 1 — approved scholarly channel
- Open references deposited at Crossref
- 94%
- ORCID iDs in current deposits
- 10%
- Enrolled in Crossref Similarity Check
- ✓
- Deposits licence metadata at Crossref
- ✓
Identity & continuity2
- Source type
- journal
- NLM unique ID (PubMed)
- 9712707
Classification(no data)
No data available to the platform for this group
No platform data for: Classification — absence is not a judgment about the journal.
Subject areas
- Electron and X-Ray Spectroscopy Techniques
- Electron and X-Ray Spectroscopy Techniques
- Advanced Electron Microscopy Techniques and Applications
- Advanced Electron Microscopy Techniques and Applications
- Advanced Materials Characterization Techniques
- Advanced Materials Characterization Techniques
- Ion-surface interactions and analysis
- Ion-surface interactions and analysis
Show all subjects (50)
- Integrated Circuits and Semiconductor Failure Analysis
- Integrated Circuits and Semiconductor Failure Analysis
- Force Microscopy Techniques and Applications
- Force Microscopy Techniques and Applications
- Advanced X-ray Imaging Techniques
- Advanced X-ray Imaging Techniques
- Electronic and Structural Properties of Oxides
- Electronic and Structural Properties of Oxides
- X-ray Spectroscopy and Fluorescence Analysis
- X-ray Spectroscopy and Fluorescence Analysis
- Machine Learning in Materials Science
- Machine Learning in Materials Science
- Semiconductor materials and devices
- Semiconductor materials and devices
- Surface and Thin Film Phenomena
- Surface and Thin Film Phenomena
- Microstructure and mechanical properties
- Microstructure and mechanical properties
- Metal and Thin Film Mechanics
- Metal and Thin Film Mechanics
- Nuclear Physics and Applications
- Nuclear Physics and Applications
- Catalytic Processes in Materials Science
- Catalytic Processes in Materials Science
- Hydrogen embrittlement and corrosion behaviors in metals
- Hydrogen embrittlement and corrosion behaviors in metals
- Advancements in Photolithography Techniques
- Advancements in Photolithography Techniques
- Advanced Fluorescence Microscopy Techniques
- Advanced Fluorescence Microscopy Techniques
- nanoparticles nucleation surface interactions
- nanoparticles nucleation surface interactions
- Advancements in Battery Materials
- Advancements in Battery Materials
- Cell Image Analysis Techniques
- Cell Image Analysis Techniques
- Magnetic properties of thin films
- Magnetic properties of thin films
- Diamond and Carbon-based Materials Research
- Diamond and Carbon-based Materials Research
- Anodic Oxide Films and Nanostructures
- Anodic Oxide Films and Nanostructures
Community confirmations — what users saw in MJL or Scopus Sources; not platform verification and never part of any score.
The journal's record in other sources:Web of Science MJLDOAJ