About the journal
Metrology and Measurement Systems is an open-access journal published by De Gruyter Open in Poland, publishing in english. It is listed in DOAJ according to the sources read. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.
Basic facts
- Publisher
- De Gruyter Open
- ISSN
- 2080-9050 · 0860-8229
- Country
- Poland
- Languages
- english
- Access
- Open access
- Declared peer-review model
- peer_review
- Official website
- http://www.metrology.pg.gda.pl
Index listings
- DOAJ · 2015-03-16
- Indexing
- —
- APC
- —
- Declared review time (DOAJ)
- —
- Activity (OpenAlex)
- Active — latest works 2026
- PublishLens list status
- Shown after sign-in
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Methodology signals (dated facts from their sources)
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Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.
Works in OpenAlex
1227
Last recorded publication year
2025
h-index
39
i10-index
336
From OpenAlex open data (CC0).
Editorial & policy4
- Observed digital preservation (Keepers registry)— snapshot 2026-10-05
- Portico
- Open references deposited at Crossref
- 0%
- ORCID iDs in current deposits
- 22%
- Enrolled in Crossref Similarity Check
- ✓
- Deposits licence metadata at Crossref
- ✓
Identity & continuity2
- Alternate titles
- Metrologiâ i IzmeritelЬnye SistemyM&MSMetrology and Measuring SystemsM&M
- Source type
- journal
Classification(no data)
No data available to the platform for this group
No platform data for: Classification — absence is not a judgment about the journal.
Subject areas
- Sensor Technology and Measurement Systems
- Sensor Technology and Measurement Systems
- Scientific Measurement and Uncertainty Evaluation
- Scientific Measurement and Uncertainty Evaluation
- Advanced Measurement and Metrology Techniques
- Advanced Measurement and Metrology Techniques
- Advanced Electrical Measurement Techniques
- Advanced Electrical Measurement Techniques
Show all subjects (50)
- Advanced Sensor Technologies Research
- Advanced Sensor Technologies Research
- Surface Roughness and Optical Measurements
- Surface Roughness and Optical Measurements
- Optical measurement and interference techniques
- Optical measurement and interference techniques
- Flow Measurement and Analysis
- Flow Measurement and Analysis
- Analog and Mixed-Signal Circuit Design
- Analog and Mixed-Signal Circuit Design
- Advanced Chemical Sensor Technologies
- Advanced Chemical Sensor Technologies
- Power Quality and Harmonics
- Power Quality and Harmonics
- Advanced machining processes and optimization
- Advanced machining processes and optimization
- Advancements in PLL and VCO Technologies
- Machine Fault Diagnosis Techniques
- Advancements in PLL and VCO Technologies
- Machine Fault Diagnosis Techniques
- Advanced Measurement and Detection Methods
- Advanced Measurement and Detection Methods
- Advanced Fiber Optic Sensors
- Advanced Fiber Optic Sensors
- Calibration and Measurement Techniques
- Gas Sensing Nanomaterials and Sensors
- Calibration and Measurement Techniques
- Analytical Chemistry and Sensors
- Analytical Chemistry and Sensors
- Gas Sensing Nanomaterials and Sensors
- Advanced MEMS and NEMS Technologies
- Advanced MEMS and NEMS Technologies
- Structural Health Monitoring Techniques
- Structural Health Monitoring Techniques
- Fault Detection and Control Systems
- VLSI and Analog Circuit Testing
- Non-Destructive Testing Techniques
- Fault Detection and Control Systems
- VLSI and Analog Circuit Testing
- Non-Destructive Testing Techniques
- Inertial Sensor and Navigation
- Inertial Sensor and Navigation
Keywords (DOAJ)
- metrology
- measurements
- sensors
- transducers
- instruments
- measurement methods
Community confirmations — what users saw in MJL or Scopus Sources; not platform verification and never part of any score.
The journal's record in other sources:Web of Science MJLDOAJ