Journal of Crystal Growth

Elsevier BV

Journal websitePeer review: Peer review
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About the journal

Journal of Crystal Growth is a journal published by Elsevier BV in Netherlands. It is listed in PUBMED according to the sources read. Declared publication charge: 2,990 USD. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.

Basic facts

Publisher
Elsevier BV
ISSN
1873-5002 · 0022-0248
Country
Netherlands
Access
Not open access / not declared
Declared publication charge
2,990 USD
Declared peer-review model
peer_review

Index listings

  • PUBMED · 1996-05-01
Indexing
PUBMED
APC
2,990 USD
Declared review time (DOAJ)
—
Activity (OpenAlex)
Active — latest works 2026
PublishLens list status
Shown after sign-in
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Methodology signals (dated facts from their sources)

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Journal profile

Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.

Works in OpenAlex

41634

Last recorded publication year

2026

Reported by OpenAlex in 1 of 3 sources (CC0 flags, not verified indexing)DOAJSciELOOpenAlex Core

h-index

206

i10-index

22558

From OpenAlex open data (CC0).

Editorial & policy4
Observed digital preservation (Keepers registry)— snapshot 2026-10-05
CLOCKSSPortico
Norwegian register (HK-dir)— 2026
Level 1 — approved scholarly channel
Open references deposited at Crossref
91%
ORCID iDs in current deposits
52%
Deposits licence metadata at Crossref
✓
Identity & continuity2
Source type
journal
NLM unique ID (PubMed)
100971389
Classification(no data)

No data available to the platform for this group

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Subject areas

  • Semiconductor Quantum Structures and Devices
  • Semiconductor Quantum Structures and Devices
  • GaN-based semiconductor devices and materials
  • GaN-based semiconductor devices and materials
  • Semiconductor materials and devices
  • Semiconductor materials and devices
  • Advanced Semiconductor Detectors and Materials
  • Advanced Semiconductor Detectors and Materials
Show all subjects (50)
  • Solidification and crystal growth phenomena
  • Solidification and crystal growth phenomena
  • Chalcogenide Semiconductor Thin Films
  • Chalcogenide Semiconductor Thin Films
  • Crystallization and Solubility Studies
  • Crystallization and Solubility Studies
  • ZnO doping and properties
  • ZnO doping and properties
  • Quantum Dots Synthesis And Properties
  • Quantum Dots Synthesis And Properties
  • nanoparticles nucleation surface interactions
  • nanoparticles nucleation surface interactions
  • Ga2O3 and related materials
  • Ga2O3 and related materials
  • Semiconductor materials and interfaces
  • Semiconductor materials and interfaces
  • Silicon and Solar Cell Technologies
  • Silicon and Solar Cell Technologies
  • Semiconductor Lasers and Optical Devices
  • Semiconductor Lasers and Optical Devices
  • Metal and Thin Film Mechanics
  • Metal and Thin Film Mechanics
  • Nanowire Synthesis and Applications
  • Nanowire Synthesis and Applications
  • Thin-Film Transistor Technologies
  • Thin-Film Transistor Technologies
  • Electronic and Structural Properties of Oxides
  • Electronic and Structural Properties of Oxides
  • Luminescence Properties of Advanced Materials
  • Luminescence Properties of Advanced Materials
  • Calcium Carbonate Crystallization and Inhibition
  • Calcium Carbonate Crystallization and Inhibition
  • Photorefractive and Nonlinear Optics
  • Photorefractive and Nonlinear Optics
  • Acoustic Wave Resonator Technologies
  • Acoustic Wave Resonator Technologies
  • Metallurgical Processes and Thermodynamics
  • Metallurgical Processes and Thermodynamics
  • Diverse Scientific and Economic Studies
  • Diverse Scientific and Economic Studies
  • Photonic and Optical Devices
  • Photonic and Optical Devices

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The journal's record in other sources:Web of Science MJLDOAJ

Everything shown here is produced automatically from named sources (DOAJ, OpenAlex, Crossref, PubMed, the Norwegian register) as of its capture date, with no human editing. Facts appear as recorded at the source; derived scores (PCI, PTD, PublishLens score) follow a published methodology. Not a judgement on the journal, not an official accreditation, not advice.

Wrong items are corrected automatically by re-reading the source (24 h for daily sources, 7 days for weekly ones) with a dated change log, and each item links to its source record. PublishLens-derived assessments are contested through the appeals mechanism (15 working days). Appeals · Indicator guide

Norwegian register data: Kanalregisteret (HK-dir, Norway) — CC BY 4.0 / NLOD — adapted: level extracted per year · OASPA member list — CC BY

Last automated source read: