e-Journal of Surface Science and Nanotechnology
The Japan Society of Vacuum and Surface Science
About the journal
e-Journal of Surface Science and Nanotechnology is an open-access journal published by The Japan Society of Vacuum and Surface Science in Japan, publishing in english. It is listed in DOAJ according to the sources read. Declared publication charge: 93 USD. Declared review time at DOAJ: 12 weeks. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.
Basic facts
- Publisher
- The Japan Society of Vacuum and Surface Science
- ISSN
- 1348-0391
- Country
- Japan
- Languages
- english
- Access
- Open access
- Declared publication charge
- 93 USD
- Articles in DOAJ
- 0
- Declared review time
- 12 weeks
- Declared peer-review model
- peer_review
- Official website
- https://www.jstage.jst.go.jp/browse/ejssnt/-char/en
Index listings
- DOAJ · 2019-01-23
- Indexing
- DOAJ
- APC
- 93 USD
- Declared review time (DOAJ)
- 12 weeks — journal-declared only (not measured)
- Activity (OpenAlex)
- Active — latest works 2026
- PublishLens list status
- Shown after sign-in
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- Choose your university and rank below ↓
Methodology signals (dated facts from their sources)
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Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.
Articles in DOAJ
0
Average review time (journal-declared via DOAJ)
12weeks
Works in OpenAlex
1596
Last recorded publication year
2026
h-index
30
i10-index
203
From OpenAlex open data (CC0).
Editorial & policy11
- Last DOAJ review date
- 2021-01-21
- Added to DOAJ
- 2019-01-23
- Declared plagiarism screening
- Declared
- Other fees beyond APC
- Yes
- Observed digital preservation (Keepers registry)— snapshot 2026-10-05
- Portico
- Editorial board
- Official page ↗
- Norwegian register (HK-dir)— 2026
- Level 1 — approved scholarly channel
- Open references deposited at Crossref
- 98%
- ORCID iDs in current deposits
- 0%
- Enrolled in Crossref Similarity Check
- ✓
- Peer-review policy
- View policy
Identity & continuity1
- Source type
- journal
Classification2
Subjects (DOAJ)
LCC codes
Subject areas
- Surface and Thin Film Phenomena
- Surface and Thin Film Phenomena
- Electron and X-Ray Spectroscopy Techniques
- Electron and X-Ray Spectroscopy Techniques
- Molecular Junctions and Nanostructures
- Molecular Junctions and Nanostructures
- Graphene research and applications
- Graphene research and applications
Show all subjects (50)
- Force Microscopy Techniques and Applications
- Force Microscopy Techniques and Applications
- Semiconductor materials and devices
- Semiconductor materials and devices
- Ion-surface interactions and analysis
- Ion-surface interactions and analysis
- Advanced Chemical Physics Studies
- Advanced Chemical Physics Studies
- Catalytic Processes in Materials Science
- Catalytic Processes in Materials Science
- Carbon Nanotubes in Composites
- Carbon Nanotubes in Composites
- ZnO doping and properties
- ZnO doping and properties
- Advanced Materials Characterization Techniques
- Advanced Materials Characterization Techniques
- Semiconductor materials and interfaces
- Semiconductor materials and interfaces
- Diamond and Carbon-based Materials Research
- Diamond and Carbon-based Materials Research
- Magnetic properties of thin films
- Magnetic properties of thin films
- Gas Sensing Nanomaterials and Sensors
- Gas Sensing Nanomaterials and Sensors
- X-ray Spectroscopy and Fluorescence Analysis
- X-ray Spectroscopy and Fluorescence Analysis
- Electronic and Structural Properties of Oxides
- Electronic and Structural Properties of Oxides
- Metal and Thin Film Mechanics
- Metal and Thin Film Mechanics
- Semiconductor Quantum Structures and Devices
- Semiconductor Quantum Structures and Devices
- Copper-based nanomaterials and applications
- Copper-based nanomaterials and applications
- Advanced Electron Microscopy Techniques and Applications
- Advanced Electron Microscopy Techniques and Applications
- Integrated Circuits and Semiconductor Failure Analysis
- Integrated Circuits and Semiconductor Failure Analysis
- GaN-based semiconductor devices and materials
- Gold and Silver Nanoparticles Synthesis and Applications
- GaN-based semiconductor devices and materials
- Gold and Silver Nanoparticles Synthesis and Applications
Keywords (DOAJ)
- surface and interface science
- nanotechnology
- vacuum science
- material science
- electronic engineering
Community confirmations — what users saw in MJL or Scopus Sources; not platform verification and never part of any score.
The journal's record in other sources:Web of Science MJLDOAJ