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About the journal
Memories - Materials, Devices, Circuits and Systems is an open-access journal published by Elsevier in United Kingdom, publishing in english. It is listed in DOAJ according to the sources read. Declared review time at DOAJ: 23 weeks. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.
Basic facts
- Publisher
- Elsevier
- ISSN
- 2773-0646
- Country
- United Kingdom
- Languages
- english
- Access
- Open access
- Articles in DOAJ
- 129
- Declared review time
- 23 weeks
- Declared peer-review model
- other
Index listings
- DOAJ · 2023-02-28
- Indexing
- DOAJ
- APC
- —
- Declared review time (DOAJ)
- 23 weeks — journal-declared only (not measured)
- Activity (OpenAlex)
- Active — latest works 2026
- PublishLens list status
- Shown after sign-in
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- Choose your university and rank below ↓
Methodology signals (dated facts from their sources)
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Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.
Articles in DOAJ
129
Most recent article
4 months ago
Average review time (journal-declared via DOAJ)
23weeks
Works in OpenAlex
133
Last recorded publication year
2025
Reported by OpenAlex in 2 of 3 sources (CC0 flags, not verified indexing)DOAJSciELOOpenAlex Core
h-index
15
i10-index
33
From OpenAlex open data (CC0).
Editorial & policy10
- Last DOAJ review date
- 2026-04-27
- Added to DOAJ
- 2023-02-28
- Declared plagiarism screening
- Declared
- Other fees beyond APC
- No
- Declared digital preservation
- CLOCKSSPortico
- Observed digital preservation (Keepers registry)— snapshot 2026-10-05
- CLOCKSSPortico
- Editorial board
- Official page ↗
- Open references deposited at Crossref
- 98%
- ORCID iDs in current deposits
- 89%
- Deposits licence metadata at Crossref
- ✓
- Peer-review policy
- View policy
Identity & continuity1
- Source type
- journal
Classification4
Subjects (DOAJ)
Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networksTechnology: Electrical engineering. Electronics. Nuclear engineering: Electronics: Computer engineering. Computer hardware
LCC codes
TK452-454.4TK7885-7895
Subject areas
- Advanced Memory and Neural Computing
- Advanced Memory and Neural Computing
- Low-power high-performance VLSI design
- Advanced Memory and Neural Computing
- Ferroelectric and Negative Capacitance Devices
- Ferroelectric and Negative Capacitance Devices
- Semiconductor materials and devices
- Semiconductor materials and devices
Show all subjects (75)
- Advancements in Semiconductor Devices and Circuit Design
- Advancements in Semiconductor Devices and Circuit Design
- Analog and Mixed-Signal Circuit Design
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Ferroelectric and Negative Capacitance Devices
- Neuroscience and Neural Engineering
- Neuroscience and Neural Engineering
- Analog and Mixed-Signal Circuit Design
- Analog and Mixed-Signal Circuit Design
- Radio Frequency Integrated Circuit Design
- Parallel Computing and Optimization Techniques
- Parallel Computing and Optimization Techniques
- Low-power high-performance VLSI design
- Low-power high-performance VLSI design
- VLSI and FPGA Design Techniques
- CCD and CMOS Imaging Sensors
- Radiation Effects in Electronics
- Advanced Data Storage Technologies
- CCD and CMOS Imaging Sensors
- Parallel Computing and Optimization Techniques
- Advanced Data Storage Technologies
- Embedded Systems Design Techniques
- Advanced Data Storage Technologies
- Radiation Effects in Electronics
- Phase-change materials and chalcogenides
- Physical Unclonable Functions (PUFs) and Hardware Security
- Electronic Packaging and Soldering Technologies
- Physical Unclonable Functions (PUFs) and Hardware Security
- Interconnection Networks and Systems
- Radio Frequency Integrated Circuit Design
- Electronic Packaging and Soldering Technologies
- Radiation Effects in Electronics
- 3D IC and TSV technologies
- Physical Unclonable Functions (PUFs) and Hardware Security
- Interconnection Networks and Systems
- Advanced Neural Network Applications
- 3D IC and TSV technologies
- Radio Frequency Integrated Circuit Design
- 3D IC and TSV technologies
- Advanced Antenna and Metasurface Technologies
- Metamaterials and Metasurfaces Applications
- Integrated Circuits and Semiconductor Failure Analysis
- Neural Networks and Applications
- Quantum-Dot Cellular Automata
- Electronic Packaging and Soldering Technologies
- Metamaterials and Metasurfaces Applications
- Metamaterials and Metasurfaces Applications
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Antenna and Metasurface Technologies
- Advanced Sensor and Energy Harvesting Materials
- Advanced Sensor and Energy Harvesting Materials
- Advanced Antenna and Metasurface Technologies
- Conducting polymers and applications
- Interconnection Networks and Systems
- Organic Electronics and Photovoltaics
- Innovative Energy Harvesting Technologies
- Quantum Computing Algorithms and Architecture
- Innovative Energy Harvesting Technologies
- Advancements in PLL and VCO Technologies
- Conducting polymers and applications
- Advancements in PLL and VCO Technologies
- Quantum Computing Algorithms and Architecture
- Thin-Film Transistor Technologies
- Chalcogenide Semiconductor Thin Films
- Advanced Neural Network Applications
- Advanced Neural Network Applications
Keywords (DOAJ)
- memories
- spintronics
- phase change
- memristor
- in-memory computing
- random access memory
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