About the journal
Power Electronic Devices and Components is an open-access journal published by Elsevier in United Kingdom, publishing in english. It is listed in DOAJ according to the sources read. Declared publication charge: 1,015 USD. Declared review time at DOAJ: 19 weeks. Facts are reproduced as recorded at their sources with their capture dates; PublishLens indicators are available after sign-in.
Basic facts
- Publisher
- Elsevier
- ISSN
- 2772-3704
- Country
- United Kingdom
- Languages
- english
- Access
- Open access
- Declared publication charge
- 1,015 USD
- Articles in DOAJ
- 131
- Declared review time
- 19 weeks
- Declared peer-review model
- peer_review
Index listings
- DOAJ · 2022-10-18
- Indexing
- DOAJ
- APC
- 1,015 USD
- Declared review time (DOAJ)
- 19 weeks — journal-declared only (not measured)
- Activity (OpenAlex)
- Active — latest works 2026
- PublishLens list status
- Shown after sign-in
- Counts for promotion at your university?
- Choose your university and rank below ↓
Methodology signals (dated facts from their sources)
Details of the evaluation under the published methodology are shown to signed-in users (free).
Create a free account to view the evaluationJournal profile
Descriptive metadata from public sources (DOAJ, OpenAlex, PubMed) as of the capture date shown — contains no assessment or judgment.
Articles in DOAJ
131
Most recent article
8 months ago
Average review time (journal-declared via DOAJ)
19weeks
Works in OpenAlex
143
Last recorded publication year
2026
h-index
12
i10-index
16
From OpenAlex open data (CC0).
Editorial & policy11
- Last DOAJ review date
- 2026-04-27
- Added to DOAJ
- 2022-10-18
- Declared plagiarism screening
- Declared
- Other fees beyond APC
- No
- Declared digital preservation
- CLOCKSSPortico
- Observed digital preservation (Keepers registry)— snapshot 2026-10-05
- CLOCKSSPortico
- Editorial board
- Official page ↗
- Open references deposited at Crossref
- 97%
- ORCID iDs in current deposits
- 85%
- Deposits licence metadata at Crossref
- ✓
- APC waiver policy
- View policy
- Peer-review policy
- View policy
Identity & continuity1
- Source type
- journal
Classification2
Subjects (DOAJ)
LCC codes
Subject areas
- Silicon Carbide Semiconductor Technologies
- Silicon Carbide Semiconductor Technologies
- GaN-based semiconductor devices and materials
- GaN-based semiconductor devices and materials
- Semiconductor materials and devices
- Electromagnetic Compatibility and Noise Suppression
- Semiconductor materials and devices
- Electromagnetic Compatibility and Noise Suppression
Show all subjects (50)
- Multilevel Inverters and Converters
- Multilevel Inverters and Converters
- Advanced DC-DC Converters
- Advanced DC-DC Converters
- Advancements in Semiconductor Devices and Circuit Design
- Advancements in Semiconductor Devices and Circuit Design
- Electrostatic Discharge in Electronics
- Electrostatic Discharge in Electronics
- Electronic Packaging and Soldering Technologies
- Electronic Packaging and Soldering Technologies
- Advanced Battery Technologies Research
- HVDC Systems and Fault Protection
- Advanced Battery Technologies Research
- HVDC Systems and Fault Protection
- 3D IC and TSV technologies
- 3D IC and TSV technologies
- Semiconductor Quantum Structures and Devices
- ZnO doping and properties
- Semiconductor Quantum Structures and Devices
- ZnO doping and properties
- Induction Heating and Inverter Technology
- Ga2O3 and related materials
- Ga2O3 and related materials
- Induction Heating and Inverter Technology
- Advanced Sensor and Energy Harvesting Materials
- Magnetic Field Sensors Techniques
- Microgrid Control and Optimization
- Magnetic Field Sensors Techniques
- Dielectric materials and actuators
- Advanced Sensor and Energy Harvesting Materials
- Microgrid Control and Optimization
- Dielectric materials and actuators
- Aluminum Alloys Composites Properties
- Radio Frequency Integrated Circuit Design
- Thin-Film Transistor Technologies
- Aluminum Alloys Composites Properties
- Ferroelectric and Piezoelectric Materials
- Ferroelectric and Piezoelectric Materials
- High voltage insulation and dielectric phenomena
- High voltage insulation and dielectric phenomena
- Radio Frequency Integrated Circuit Design
- Thin-Film Transistor Technologies
Keywords (DOAJ)
- power electronic devices
- power electronic components
- passive devices
- emerging power devices
Community confirmations — what users saw in MJL or Scopus Sources; not platform verification and never part of any score.
The journal's record in other sources:Web of Science MJLDOAJ